Application of Atomic Force Microscopy in the Study of Polysaccharide

Application of Atomic Force Microscopy in the Study of Polysaccharide

This paper gives a brief introduction to basic principle and working mode of atomic force microscope （AFM）. Sample preparation methods and factors that affect the AFM imaging of polysaccharide are described in detail. Advance in using AFM for morphological observation and quantitative study on polys...

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Veröffentlicht in:Agricultural sciences in China 2009-12, Vol.8 (12), p.1458-1465
Hauptverfasser: WU, Jia, DENG, Xiao, ZHANG, Yun, WANG, Lan, TIAN, Bing-qiang, XIE, Bi-jun
Format: Artikel
Sprache:eng
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AFM
制备方法
原子力显微镜
形态学观察
影响因素
构象变化
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container_end_page 1465
container_issue 12
container_start_page 1458
container_title Agricultural sciences in China
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creator WU, Jia
DENG, Xiao
ZHANG, Yun
WANG, Lan
TIAN, Bing-qiang
XIE, Bi-jun
description This paper gives a brief introduction to basic principle and working mode of atomic force microscope （AFM）. Sample preparation methods and factors that affect the AFM imaging of polysaccharide are described in detail. Advance in using AFM for morphological observation and quantitative study on polysaccharide molecules are reviewed. Research on single molecule force spectroscopy of polysaccharide and determination and adjustment of conformational change of sugar residue are introduced. Perspective on further application of AFM in polysaccharide investigation is presented.
doi_str_mv 10.1016/S1671-2927(08)60359-4
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subjects AFM
制备方法
原子力显微镜
形态学观察
影响因素
构象变化
title Application of Atomic Force Microscopy in the Study of Polysaccharide
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