Annealing effects on the optical and electrochemical properties of tantalum pentoxide films
Tantalum pentoxide (Ta 2 O 5 ) has attracted intensive attention due to their excellent physicochemical properties. Ta 2 O 5 films were synthesized via electron beam evaporation (EBE) and subsequently annealed at different temperatures ranging from 300 to 900 °C. X-ray diffraction (XRD) results show...
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| Veröffentlicht in: | Journal of advanced ceramics 2021-08, Vol.10 (4), p.704-713 |
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| creator | Ren, Wei Yang, Guang-Dao Feng, Ai-Ling Miao, Rui-Xia Xia, Jun-Bo Wang, Yong-Gang |
| description | Tantalum pentoxide (Ta
2
O
5
) has attracted intensive attention due to their excellent physicochemical properties. Ta
2
O
5
films were synthesized via electron beam evaporation (EBE) and subsequently annealed at different temperatures ranging from 300 to 900 °C. X-ray diffraction (XRD) results show that amorphous Ta
2
O
5
thin films form from 300 to 700 °C and then a phase transition to polycrystalline β-Ta
2
O
5
films occurs since 900 °C. The surface morphology of the Ta
2
O
5
films is uniform and smooth. The resulted Ta
2
O
5
films exhibit excellent transmittance properties for wavelengths ranging from 300 to 1100 nm. The bandgap of the Ta
2
O
5
films is broadened from 4.32 to 4.46 eV by annealing. The 900 °C polycrystalline film electrode has improved electrochemical stability, compared to the other amorphous counterparts. |
| doi_str_mv | 10.1007/s40145-021-0465-2 |
| format | Article |
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2
O
5
) has attracted intensive attention due to their excellent physicochemical properties. Ta
2
O
5
films were synthesized via electron beam evaporation (EBE) and subsequently annealed at different temperatures ranging from 300 to 900 °C. X-ray diffraction (XRD) results show that amorphous Ta
2
O
5
thin films form from 300 to 700 °C and then a phase transition to polycrystalline β-Ta
2
O
5
films occurs since 900 °C. The surface morphology of the Ta
2
O
5
films is uniform and smooth. The resulted Ta
2
O
5
films exhibit excellent transmittance properties for wavelengths ranging from 300 to 1100 nm. The bandgap of the Ta
2
O
5
films is broadened from 4.32 to 4.46 eV by annealing. The 900 °C polycrystalline film electrode has improved electrochemical stability, compared to the other amorphous counterparts.</description><identifier>ISSN: 2226-4108</identifier><identifier>EISSN: 2227-8508</identifier><identifier>DOI: 10.1007/s40145-021-0465-2</identifier><language>eng</language><publisher>Beijing: Tsinghua University Press</publisher><subject>Analysis ; Annealing ; Ceramics ; Characterization and Evaluation of Materials ; Chemical properties ; Chemistry and Materials Science ; Composites ; Dielectric films ; Diffraction ; Electrochemical analysis ; Electron beams ; Glass ; Materials Science ; Morphology ; Nanotechnology ; Natural Materials ; Optical properties ; Phase transitions ; Polycrystals ; Research Article ; Structural Materials ; Tantalum ; Tantalum oxides ; Thin films ; X-rays</subject><ispartof>Journal of advanced ceramics, 2021-08, Vol.10 (4), p.704-713</ispartof><rights>The Author(s) 2021</rights><rights>COPYRIGHT 2021 Springer</rights><rights>The Author(s) 2021. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><rights>Copyright © Wanfang Data Co. Ltd. All Rights Reserved.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c430t-7700c6774f87124965fc5a427eed496ee5a33caa80a6d4cac80af8631532b8a33</citedby><cites>FETCH-LOGICAL-c430t-7700c6774f87124965fc5a427eed496ee5a33caa80a6d4cac80af8631532b8a33</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttp://www.wanfangdata.com.cn/images/PeriodicalImages/xjtc-e/xjtc-e.jpg</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s40145-021-0465-2$$EPDF$$P50$$Gspringer$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://doi.org/10.1007/s40145-021-0465-2$$EHTML$$P50$$Gspringer$$Hfree_for_read</linktohtml><link.rule.ids>315,781,785,865,27925,27926,41121,42190,51577</link.rule.ids></links><search><creatorcontrib>Ren, Wei</creatorcontrib><creatorcontrib>Yang, Guang-Dao</creatorcontrib><creatorcontrib>Feng, Ai-Ling</creatorcontrib><creatorcontrib>Miao, Rui-Xia</creatorcontrib><creatorcontrib>Xia, Jun-Bo</creatorcontrib><creatorcontrib>Wang, Yong-Gang</creatorcontrib><title>Annealing effects on the optical and electrochemical properties of tantalum pentoxide films</title><title>Journal of advanced ceramics</title><addtitle>J Adv Ceram</addtitle><description>Tantalum pentoxide (Ta
2
O
5
) has attracted intensive attention due to their excellent physicochemical properties. Ta
2
O
5
films were synthesized via electron beam evaporation (EBE) and subsequently annealed at different temperatures ranging from 300 to 900 °C. X-ray diffraction (XRD) results show that amorphous Ta
2
O
5
thin films form from 300 to 700 °C and then a phase transition to polycrystalline β-Ta
2
O
5
films occurs since 900 °C. The surface morphology of the Ta
2
O
5
films is uniform and smooth. The resulted Ta
2
O
5
films exhibit excellent transmittance properties for wavelengths ranging from 300 to 1100 nm. The bandgap of the Ta
2
O
5
films is broadened from 4.32 to 4.46 eV by annealing. The 900 °C polycrystalline film electrode has improved electrochemical stability, compared to the other amorphous counterparts.</description><subject>Analysis</subject><subject>Annealing</subject><subject>Ceramics</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemical properties</subject><subject>Chemistry and Materials Science</subject><subject>Composites</subject><subject>Dielectric films</subject><subject>Diffraction</subject><subject>Electrochemical analysis</subject><subject>Electron beams</subject><subject>Glass</subject><subject>Materials Science</subject><subject>Morphology</subject><subject>Nanotechnology</subject><subject>Natural Materials</subject><subject>Optical properties</subject><subject>Phase transitions</subject><subject>Polycrystals</subject><subject>Research Article</subject><subject>Structural Materials</subject><subject>Tantalum</subject><subject>Tantalum oxides</subject><subject>Thin films</subject><subject>X-rays</subject><issn>2226-4108</issn><issn>2227-8508</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>C6C</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNp1kcFu3CAQhq0qlRpt8gC9IfXQk9MBg8HHVdQmlSLlkpx6QFM8bLzyggusmrx92LhSTj0xMN8_Mz_TNJ85XHEA_S1L4FK1IHgLslet-NCcCyF0axSYs7e4byUH86m5zHkPALyTfBj0efNrGwLhPIUdI-_JlcxiYOWJWFzK5HBmGEZGc82k6J7o8Pa2pLhQKhNV2rOCoeB8PLCFQonP00jMT_MhXzQfPc6ZLv-dm-bxx_eH69v27v7m5_X2rnWyg9JqDeB6raU3mgs59Mo7hVJoorHeiBR2nUM0gP0oHboaeNN3XHXit6m5TfN1rfsXg8ews_t4TKF2tM_74iyJ-jEgAU7kl5WsBv4cKZd3VCgltDJDJyt1tVI7nMlOwceSsPbF8WQ_BqruyG61MFwNRvZVwFeBSzHnRN4uaTpgerEc7GlDdt2QrYPY04asqBqxanJlw47S-yj_F70CB-iSeQ</recordid><startdate>20210801</startdate><enddate>20210801</enddate><creator>Ren, Wei</creator><creator>Yang, Guang-Dao</creator><creator>Feng, Ai-Ling</creator><creator>Miao, Rui-Xia</creator><creator>Xia, Jun-Bo</creator><creator>Wang, Yong-Gang</creator><general>Tsinghua University Press</general><general>Springer</general><general>Springer Nature B.V</general><general>School of Science & School of Electronic Engineering,Xi 'an University of Posts &Telecommunications,Xi 'an 710121,China%School of Physics and Information Technology,Shaanxi Normal University,Xi 'an 710119,China%Institute of Physics & Optoelectronics Technology,Baoji University of Arts and Sciences,Baoji 721016,China</general><scope>C6C</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>7SR</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>PDBOC</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>2B.</scope><scope>4A8</scope><scope>92I</scope><scope>93N</scope><scope>PSX</scope><scope>TCJ</scope></search><sort><creationdate>20210801</creationdate><title>Annealing effects on the optical and electrochemical properties of tantalum pentoxide films</title><author>Ren, Wei ; Yang, Guang-Dao ; Feng, Ai-Ling ; Miao, Rui-Xia ; Xia, Jun-Bo ; Wang, Yong-Gang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c430t-7700c6774f87124965fc5a427eed496ee5a33caa80a6d4cac80af8631532b8a33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Analysis</topic><topic>Annealing</topic><topic>Ceramics</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemical properties</topic><topic>Chemistry and Materials Science</topic><topic>Composites</topic><topic>Dielectric films</topic><topic>Diffraction</topic><topic>Electrochemical analysis</topic><topic>Electron beams</topic><topic>Glass</topic><topic>Materials Science</topic><topic>Morphology</topic><topic>Nanotechnology</topic><topic>Natural Materials</topic><topic>Optical properties</topic><topic>Phase transitions</topic><topic>Polycrystals</topic><topic>Research Article</topic><topic>Structural Materials</topic><topic>Tantalum</topic><topic>Tantalum oxides</topic><topic>Thin films</topic><topic>X-rays</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ren, Wei</creatorcontrib><creatorcontrib>Yang, Guang-Dao</creatorcontrib><creatorcontrib>Feng, Ai-Ling</creatorcontrib><creatorcontrib>Miao, Rui-Xia</creatorcontrib><creatorcontrib>Xia, Jun-Bo</creatorcontrib><creatorcontrib>Wang, Yong-Gang</creatorcontrib><collection>Springer Nature OA Free Journals</collection><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Materials Science Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Wanfang Data Journals - Hong Kong</collection><collection>WANFANG Data Centre</collection><collection>Wanfang Data Journals</collection><collection>万方数据期刊 - 香港版</collection><collection>China Online Journals (COJ)</collection><collection>China Online Journals (COJ)</collection><jtitle>Journal of advanced ceramics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ren, Wei</au><au>Yang, Guang-Dao</au><au>Feng, Ai-Ling</au><au>Miao, Rui-Xia</au><au>Xia, Jun-Bo</au><au>Wang, Yong-Gang</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Annealing effects on the optical and electrochemical properties of tantalum pentoxide films</atitle><jtitle>Journal of advanced ceramics</jtitle><stitle>J Adv Ceram</stitle><date>2021-08-01</date><risdate>2021</risdate><volume>10</volume><issue>4</issue><spage>704</spage><epage>713</epage><pages>704-713</pages><issn>2226-4108</issn><eissn>2227-8508</eissn><abstract>Tantalum pentoxide (Ta
2
O
5
) has attracted intensive attention due to their excellent physicochemical properties. Ta
2
O
5
films were synthesized via electron beam evaporation (EBE) and subsequently annealed at different temperatures ranging from 300 to 900 °C. X-ray diffraction (XRD) results show that amorphous Ta
2
O
5
thin films form from 300 to 700 °C and then a phase transition to polycrystalline β-Ta
2
O
5
films occurs since 900 °C. The surface morphology of the Ta
2
O
5
films is uniform and smooth. The resulted Ta
2
O
5
films exhibit excellent transmittance properties for wavelengths ranging from 300 to 1100 nm. The bandgap of the Ta
2
O
5
films is broadened from 4.32 to 4.46 eV by annealing. The 900 °C polycrystalline film electrode has improved electrochemical stability, compared to the other amorphous counterparts.</abstract><cop>Beijing</cop><pub>Tsinghua University Press</pub><doi>10.1007/s40145-021-0465-2</doi><tpages>10</tpages><oa>free_for_read</oa></addata></record> |
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| ispartof | Journal of advanced ceramics, 2021-08, Vol.10 (4), p.704-713 |
| issn | 2226-4108 2227-8508 |
| language | eng |
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| source | DOAJ Directory of Open Access Journals; Springer Nature OA Free Journals; EZB-FREE-00999 freely available EZB journals; Free Full-Text Journals in Chemistry |
| subjects | Analysis Annealing Ceramics Characterization and Evaluation of Materials Chemical properties Chemistry and Materials Science Composites Dielectric films Diffraction Electrochemical analysis Electron beams Glass Materials Science Morphology Nanotechnology Natural Materials Optical properties Phase transitions Polycrystals Research Article Structural Materials Tantalum Tantalum oxides Thin films X-rays |
| title | Annealing effects on the optical and electrochemical properties of tantalum pentoxide films |
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