Molecular Dynamics of Nanometric Processing of Ion Implanted Monocrystalline Silicon Surfaces
Three-dimensional molecular dynamics simulations are carried out to study the mechanism of nanometric processing of ion implanted monocrystalline silicon surfaces. Lattice transformation is observed during implantation and nano-indentation using radial distribution function and geometric criterion d...
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Veröffentlicht in: | Transactions of Tianjin University 2014, Vol.20 (3), p.203-209 |
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creator | 陈耘辉 房丰洲 张效栋 胡小唐 |
description | Three-dimensional molecular dynamics simulations are carried out to study the mechanism of nanometric processing of ion implanted monocrystalline silicon surfaces. Lattice transformation is observed during implantation and nano-indentation using radial distribution function and geometric criterion damage detection. Nano-indentation is simulated to study the changes of mechanical property. Implantation analysis shows the existence of amorphous phase. Indentation process shows the lattice evolution, which is beneficial for reducing fractures during processing. The indentation results reveal the reduction of brittleness and hardness of the implanted surface. The ion fluence is in direct proportion to the damage, and inverse to the hardness of the material. Experiments of ion implar, tation, nanoindentation, nano-scratching and nanometric cutting were carried out to verify the simulation results. |
doi_str_mv | 10.1007/s12209-014-2336-1 |
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Lattice transformation is observed during implantation and nano-indentation using radial distribution function and geometric criterion damage detection. Nano-indentation is simulated to study the changes of mechanical property. Implantation analysis shows the existence of amorphous phase. Indentation process shows the lattice evolution, which is beneficial for reducing fractures during processing. The indentation results reveal the reduction of brittleness and hardness of the implanted surface. The ion fluence is in direct proportion to the damage, and inverse to the hardness of the material. Experiments of ion implar, tation, nanoindentation, nano-scratching and nanometric cutting were carried out to verify the simulation results.</description><identifier>ISSN: 1006-4982</identifier><identifier>EISSN: 1995-8196</identifier><identifier>DOI: 10.1007/s12209-014-2336-1</identifier><language>eng</language><publisher>Heidelberg: Tianjin University</publisher><subject>Engineering ; Humanities and Social Sciences ; Mechanical Engineering ; multidisciplinary ; Science ; 分子动力学模拟 ; 单晶硅表面 ; 径向分布函数 ; 损伤检测 ; 离子注入 ; 纳米加工 ; 纳米压痕 ; 纳米处理</subject><ispartof>Transactions of Tianjin University, 2014, Vol.20 (3), p.203-209</ispartof><rights>Tianjin University and Springer-Verlag Berlin Heidelberg 2014</rights><rights>Copyright © Wanfang Data Co. Ltd. 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Tianjin Univ</addtitle><addtitle>Transactions of Tianjin University</addtitle><description>Three-dimensional molecular dynamics simulations are carried out to study the mechanism of nanometric processing of ion implanted monocrystalline silicon surfaces. Lattice transformation is observed during implantation and nano-indentation using radial distribution function and geometric criterion damage detection. Nano-indentation is simulated to study the changes of mechanical property. Implantation analysis shows the existence of amorphous phase. Indentation process shows the lattice evolution, which is beneficial for reducing fractures during processing. The indentation results reveal the reduction of brittleness and hardness of the implanted surface. The ion fluence is in direct proportion to the damage, and inverse to the hardness of the material. Experiments of ion implar, tation, nanoindentation, nano-scratching and nanometric cutting were carried out to verify the simulation results.</description><subject>Engineering</subject><subject>Humanities and Social Sciences</subject><subject>Mechanical Engineering</subject><subject>multidisciplinary</subject><subject>Science</subject><subject>分子动力学模拟</subject><subject>单晶硅表面</subject><subject>径向分布函数</subject><subject>损伤检测</subject><subject>离子注入</subject><subject>纳米加工</subject><subject>纳米压痕</subject><subject>纳米处理</subject><issn>1006-4982</issn><issn>1995-8196</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNp9kMtOwzAQRSMEEqXwAezCnsCMkzj2EpVXpfKQCktkOY4TUiV2sVvR_j2uUsGOlceae-ZIN4rOEa4QoLj2SAjwBDBLSJrSBA-iEXKeJww5PQwzAE0yzshxdOL9AiDjUOAo-niynVbrTrr4dmtk3yof2zp-lsb2euVaFb86q7T3rWl2i6k18bRfdtKsdBU_WWOV2_qV7LrW6Hjedq0Kifna1TJQp9FRLTuvz_bvOHq_v3ubPCazl4fp5GaWKEIpS6RSOZaUAaUqL6HEOq9KzVXKSMkkkCJDWjAZforzKi2IopkmkuqyhBopS8fR5XD3W5pamkYs7NqZYBSrVppFtdmUQpNQDqQAuzgOceWs907XYunaXrqtQBC7OsVQpwiE2NUpMDBkYHzImka7P8d_0MVe9GlN8xW4X1MOCIykmP4AjzWECA</recordid><startdate>2014</startdate><enddate>2014</enddate><creator>陈耘辉 房丰洲 张效栋 胡小唐</creator><general>Tianjin University</general><general>State Key Laboratory of Precision Measuring Technology and Instruments, School of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China</general><scope>2RA</scope><scope>92L</scope><scope>CQIGP</scope><scope>~WA</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>2B.</scope><scope>4A8</scope><scope>92I</scope><scope>93N</scope><scope>PSX</scope><scope>TCJ</scope></search><sort><creationdate>2014</creationdate><title>Molecular Dynamics of Nanometric Processing of Ion Implanted Monocrystalline Silicon Surfaces</title><author>陈耘辉 房丰洲 张效栋 胡小唐</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2668-acc51b68066c5b0b1f5dbe9c382b8a02741678a82bc99d372c64e2a6ebb0f1683</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Engineering</topic><topic>Humanities and Social Sciences</topic><topic>Mechanical Engineering</topic><topic>multidisciplinary</topic><topic>Science</topic><topic>分子动力学模拟</topic><topic>单晶硅表面</topic><topic>径向分布函数</topic><topic>损伤检测</topic><topic>离子注入</topic><topic>纳米加工</topic><topic>纳米压痕</topic><topic>纳米处理</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>陈耘辉 房丰洲 张效栋 胡小唐</creatorcontrib><collection>中文科技期刊数据库</collection><collection>中文科技期刊数据库-CALIS站点</collection><collection>中文科技期刊数据库-7.0平台</collection><collection>中文科技期刊数据库- 镜像站点</collection><collection>CrossRef</collection><collection>Wanfang Data Journals - Hong Kong</collection><collection>WANFANG Data Centre</collection><collection>Wanfang Data Journals</collection><collection>万方数据期刊 - 香港版</collection><collection>China Online Journals (COJ)</collection><collection>China Online Journals (COJ)</collection><jtitle>Transactions of Tianjin University</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>陈耘辉 房丰洲 张效栋 胡小唐</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Molecular Dynamics of Nanometric Processing of Ion Implanted Monocrystalline Silicon Surfaces</atitle><jtitle>Transactions of Tianjin University</jtitle><stitle>Trans. Tianjin Univ</stitle><addtitle>Transactions of Tianjin University</addtitle><date>2014</date><risdate>2014</risdate><volume>20</volume><issue>3</issue><spage>203</spage><epage>209</epage><pages>203-209</pages><issn>1006-4982</issn><eissn>1995-8196</eissn><abstract>Three-dimensional molecular dynamics simulations are carried out to study the mechanism of nanometric processing of ion implanted monocrystalline silicon surfaces. Lattice transformation is observed during implantation and nano-indentation using radial distribution function and geometric criterion damage detection. Nano-indentation is simulated to study the changes of mechanical property. Implantation analysis shows the existence of amorphous phase. Indentation process shows the lattice evolution, which is beneficial for reducing fractures during processing. The indentation results reveal the reduction of brittleness and hardness of the implanted surface. 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source | Alma/SFX Local Collection; SpringerLink Journals - AutoHoldings |
subjects | Engineering Humanities and Social Sciences Mechanical Engineering multidisciplinary Science 分子动力学模拟 单晶硅表面 径向分布函数 损伤检测 离子注入 纳米加工 纳米压痕 纳米处理 |
title | Molecular Dynamics of Nanometric Processing of Ion Implanted Monocrystalline Silicon Surfaces |
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