Role of Thermal Stresses in Degradation of High Power Laser Diodes
Catastrophic degradation of high power laser diodes is due to the generation of extended defects inside the active parts of the laser structure during the laser operation. The mechanism driving the degradation is strongly re- lated to the existence of localized thermal stresses generated during the...
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| Veröffentlicht in: | Transactions of Nanjing University of Aeronautics & Astronautics 2014-04, Vol.31 (2), p.186-190 |
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| container_title | Transactions of Nanjing University of Aeronautics & Astronautics |
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| creator | Jimenez, Juan Anaya, Julian Souto, Jorge |
| description | Catastrophic degradation of high power laser diodes is due to the generation of extended defects inside the active parts of the laser structure during the laser operation. The mechanism driving the degradation is strongly re- lated to the existence of localized thermal stresses generated during the laser operation. These thermal stresses can overcome the yield strength of the materials forming the active part of the laser diode. Different factors contribute to reduce the laser power threshold for degradation. Among them the thermal transport across the laser structure constitutes a critical issue for the reliability of the device. |
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Among them the thermal transport across the laser structure constitutes a critical issue for the reliability of the device.</description><subject>Aircraft components</subject><subject>Degradation</subject><subject>Diodes</subject><subject>High power lasers</subject><subject>Lasers</subject><subject>Thermal stresses</subject><subject>Transport</subject><subject>Yield strength</subject><issn>1005-1120</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNqF0D1PwzAQBuAMIFGV_oewsUTyRxw7I7RAkSqBoMyRPy6JS2q3dqqWf4-rsrPcLY_e93RX2QQjxAqMCbrJZjFahVDFEeWimmSPH36A3Lf5uoewlUP-OQaIEWJuXb6ALkgjR-vdmSxt1-fv_gghX8mY5sJ6A_E2u27lEGH2t6fZ1_PTer4sVm8vr_OHVaHJuV9rSojhSNXMYEJZ3WIDqgKsOFBKa6O1EAyYajFILlpKlFK6rI1oRS25odOsuOQepWul65qNPwSXGhu36b_70ZxOqgGCcInSYMnfX_wu-P0B4thsbdQwDNKBP8QGV1wgxAUT_1OWHsarWpBE7y5U9951e5vu2AW7leGnKeuUVTJMfwE9AHBH</recordid><startdate>20140401</startdate><enddate>20140401</enddate><creator>Jimenez, Juan</creator><creator>Anaya, Julian</creator><creator>Souto, Jorge</creator><general>GdS Optronlab,Ed. i+d,Universidad de Valladolid,Valladolid,Spain</general><scope>2RA</scope><scope>92L</scope><scope>CQIGP</scope><scope>W92</scope><scope>~WA</scope><scope>7SP</scope><scope>7TB</scope><scope>7U5</scope><scope>8FD</scope><scope>FR3</scope><scope>H8D</scope><scope>KR7</scope><scope>L7M</scope><scope>2B.</scope><scope>4A8</scope><scope>92I</scope><scope>93N</scope><scope>PSX</scope><scope>TCJ</scope></search><sort><creationdate>20140401</creationdate><title>Role of Thermal Stresses in Degradation of High Power Laser Diodes</title><author>Jimenez, Juan ; Anaya, Julian ; Souto, Jorge</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2005-cc322d70b95d12359f1deb6e1b7e3339dcc885e5bf1ea78f32bbbc49d8f89a7d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Aircraft components</topic><topic>Degradation</topic><topic>Diodes</topic><topic>High power lasers</topic><topic>Lasers</topic><topic>Thermal stresses</topic><topic>Transport</topic><topic>Yield strength</topic><toplevel>online_resources</toplevel><creatorcontrib>Jimenez, Juan</creatorcontrib><creatorcontrib>Anaya, Julian</creatorcontrib><creatorcontrib>Souto, Jorge</creatorcontrib><collection>中文科技期刊数据库</collection><collection>中文科技期刊数据库-CALIS站点</collection><collection>中文科技期刊数据库-7.0平台</collection><collection>中文科技期刊数据库-工程技术</collection><collection>中文科技期刊数据库- 镜像站点</collection><collection>Electronics & Communications Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Wanfang Data Journals - Hong Kong</collection><collection>WANFANG Data Centre</collection><collection>Wanfang Data Journals</collection><collection>万方数据期刊 - 香港版</collection><collection>China Online Journals (COJ)</collection><collection>China Online Journals (COJ)</collection><jtitle>Transactions of Nanjing University of Aeronautics & Astronautics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Jimenez, Juan</au><au>Anaya, Julian</au><au>Souto, Jorge</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Role of Thermal Stresses in Degradation of High Power Laser Diodes</atitle><jtitle>Transactions of Nanjing University of Aeronautics & Astronautics</jtitle><addtitle>Transactions of Nanjing University of Aeronautics ＆ Astronautics</addtitle><date>2014-04-01</date><risdate>2014</risdate><volume>31</volume><issue>2</issue><spage>186</spage><epage>190</epage><pages>186-190</pages><issn>1005-1120</issn><abstract>Catastrophic degradation of high power laser diodes is due to the generation of extended defects inside the active parts of the laser structure during the laser operation. 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| fulltext | fulltext |
| identifier | ISSN: 1005-1120 |
| ispartof | Transactions of Nanjing University of Aeronautics & Astronautics, 2014-04, Vol.31 (2), p.186-190 |
| issn | 1005-1120 |
| language | eng |
| recordid | cdi_wanfang_journals_njhkhtdxxb_e201402015 |
| source | Alma/SFX Local Collection |
| subjects | Aircraft components Degradation Diodes High power lasers Lasers Thermal stresses Transport Yield strength |
| title | Role of Thermal Stresses in Degradation of High Power Laser Diodes |
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