A Fast Defects Location Method in ICT Images Based on Block Fractal Dimension

Non-destructive testing （NDT） has been widely used in many fields, we can easily see it is being used in shipbuilding, aerospace, weapons manufacturing and so on. ICT is one of the best non destructive testing methods currently, but it has not been used widely, because it requires much compute and costs much time. Defect location is one of the most important processing steps in the digital image analysis. Defect location would correspondingly reduce the time spent in the testing. We may only require locating the defects in some case. So, we divide the CT images into several little blocks which the square is equal, and then calculate the fractal on each block. By determining the value and connected region number of the fractal dimension, we can locate defects of the image. The results show that the block ffactal dimension is a useful and time-saving defect location method.