Influences of working pressure on properties for TiO2 films deposited by DC pulse magnetron sputtering

TiO2 films were deposited at room temperature by DC pulse magnetron sputtering system. The crystalline structures, morphological features and photocatalytic activity of TiO2 films were systematically investigated by X-ray diffraction (XRD), atomic force microscopy (AFM) and ultraviolet spectrophotom...

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Veröffentlicht in:Journal of environmental sciences (China) 2009, Vol.21 (6), p.741-744
Hauptverfasser: Zhang, Can, Ding, Wanyu, Wang, Hualin, Chai, Weiping, Ju, Dongying
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container_issue 6
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container_title Journal of environmental sciences (China)
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creator Zhang, Can
Ding, Wanyu
Wang, Hualin
Chai, Weiping
Ju, Dongying
description TiO2 films were deposited at room temperature by DC pulse magnetron sputtering system. The crystalline structures, morphological features and photocatalytic activity of TiO2 films were systematically investigated by X-ray diffraction (XRD), atomic force microscopy (AFM) and ultraviolet spectrophotometer, respectively. The results indicated that working pressure was the key deposition parameter influencing the TiO2 film phase composition at room temperature, which directly affected its photocatalytic activity. With increasing working pressure, the target self-bias decreases monotonously. Therefore, low temperature TiO2 phase (anatase) could be deposited with high working pressure. The anatase TiO2 films deposited with 1.4 Pa working pressure displayed the highest photocatalytic activity by the decomposition of Methyl Orange solution, which the degradation rate reached the maximum (35%) after irradiation by ultraviolet light for 1 h.
doi_str_mv 10.1016/s1001-0742(08)62334-7
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subjects Azo Compounds - chemistry
Electrochemical Techniques
Indicators and Reagents - chemistry
Microscopy, Atomic Force
Pressure
Temperature
Titanium - chemistry
X-Ray Diffraction
title Influences of working pressure on properties for TiO2 films deposited by DC pulse magnetron sputtering
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