Microstructure Characterization of Long W Core SiC Fiber

Microstructure of SiC fiber manufactured by chemical vapor deposition (CVD) onto tungsten (W) wire core was investigated by analytical electron microscopy (AEM). The results reveal that the fiber consists of W core, SiC sheath and C-coating. SiC sheath could be subdivided into two parts according to...

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Veröffentlicht in:Journal of materials science & technology 2007-09, Vol.23 (5), p.677-684
Hauptverfasser: Guo, Changyou, Zhang, Caibei, He, Lianlong, Jin, Baohong, Shi, Nanlin
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creator Guo, Changyou
Zhang, Caibei
He, Lianlong
Jin, Baohong
Shi, Nanlin
description Microstructure of SiC fiber manufactured by chemical vapor deposition (CVD) onto tungsten (W) wire core was investigated by analytical electron microscopy (AEM). The results reveal that the fiber consists of W core, SiC sheath and C-coating. SiC sheath could be subdivided into two parts according to whether containing C rich stripe, or not. An emphasis was put on W/SiC interfacial reaction products and the transition zone between sub-layers in SiC sheath. The W/SiC interface consists of three layers of reaction production, namely, W2 C, W5Si3 and WC. And there are amounts of facet faults existing in (100) face of WC crystalline and two classes of stack faults in WC have been revealed. The formation essence of different sublayers in SiC sheath was also discussed.
doi_str_mv 10.3321/j.issn:1005-0302.2007.05.022
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fullrecord <record><control><sourceid>wanfang_jour_proqu</sourceid><recordid>TN_cdi_wanfang_journals_clkxjsxb_e200705022</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><wanfj_id>clkxjsxb_e200705022</wanfj_id><sourcerecordid>clkxjsxb_e200705022</sourcerecordid><originalsourceid>FETCH-LOGICAL-p222t-1ff7b17ba379ba3ad0286e3e97ecb3586f775b80e9e77783fe517b9308d93c273</originalsourceid><addsrcrecordid>eNo9j01LxDAQhnNQcP34Dz2IF2mdZMwm9SbFVWHFg4rHkmYna2pt1qTFxV9vZcXLvDDvwwwPY6ccCkTBL9rCp9RfcQCZA4IoBIAqQBYgxB6b_e8P2GFKLQAqqfWM6QdvY0hDHO0wRsqqNxONHSj6bzP40GfBZcvQr7PXrApT_-SrbOEbisds35ku0clfHrGXxc1zdZcvH2_vq-tlvhFCDDl3TjVcNQZVOQ2zAqHnhFQqsg1KPXdKyUYDlaSU0uhITnSJoFclWqHwiJ3v7n6Z3pl-XbdhjP30sbbd-7ZN26amX1WQk-hEn-3oTQyfI6Wh_vDJUteZnsKYagTOOcIl_gAMllmA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>30111304</pqid></control><display><type>article</type><title>Microstructure Characterization of Long W Core SiC Fiber</title><source>Alma/SFX Local Collection</source><creator>Guo, Changyou ; Zhang, Caibei ; He, Lianlong ; Jin, Baohong ; Shi, Nanlin</creator><creatorcontrib>Guo, Changyou ; Zhang, Caibei ; He, Lianlong ; Jin, Baohong ; Shi, Nanlin</creatorcontrib><description>Microstructure of SiC fiber manufactured by chemical vapor deposition (CVD) onto tungsten (W) wire core was investigated by analytical electron microscopy (AEM). The results reveal that the fiber consists of W core, SiC sheath and C-coating. SiC sheath could be subdivided into two parts according to whether containing C rich stripe, or not. An emphasis was put on W/SiC interfacial reaction products and the transition zone between sub-layers in SiC sheath. The W/SiC interface consists of three layers of reaction production, namely, W2 C, W5Si3 and WC. And there are amounts of facet faults existing in (100) face of WC crystalline and two classes of stack faults in WC have been revealed. The formation essence of different sublayers in SiC sheath was also discussed.</description><identifier>ISSN: 1005-0302</identifier><identifier>DOI: 10.3321/j.issn:1005-0302.2007.05.022</identifier><language>eng</language><publisher>Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences,Shenyang 110016, China%College of Sciences, Northeastern University, Shenyang 110004, China%Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences,Shenyang 110016, China%Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China</publisher><ispartof>Journal of materials science &amp; technology, 2007-09, Vol.23 (5), p.677-684</ispartof><rights>Copyright © Wanfang Data Co. Ltd. All Rights Reserved.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttp://www.wanfangdata.com.cn/images/PeriodicalImages/clkxjsxb-e/clkxjsxb-e.jpg</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids></links><search><creatorcontrib>Guo, Changyou</creatorcontrib><creatorcontrib>Zhang, Caibei</creatorcontrib><creatorcontrib>He, Lianlong</creatorcontrib><creatorcontrib>Jin, Baohong</creatorcontrib><creatorcontrib>Shi, Nanlin</creatorcontrib><title>Microstructure Characterization of Long W Core SiC Fiber</title><title>Journal of materials science &amp; technology</title><description>Microstructure of SiC fiber manufactured by chemical vapor deposition (CVD) onto tungsten (W) wire core was investigated by analytical electron microscopy (AEM). The results reveal that the fiber consists of W core, SiC sheath and C-coating. SiC sheath could be subdivided into two parts according to whether containing C rich stripe, or not. An emphasis was put on W/SiC interfacial reaction products and the transition zone between sub-layers in SiC sheath. The W/SiC interface consists of three layers of reaction production, namely, W2 C, W5Si3 and WC. And there are amounts of facet faults existing in (100) face of WC crystalline and two classes of stack faults in WC have been revealed. The formation essence of different sublayers in SiC sheath was also discussed.</description><issn>1005-0302</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNo9j01LxDAQhnNQcP34Dz2IF2mdZMwm9SbFVWHFg4rHkmYna2pt1qTFxV9vZcXLvDDvwwwPY6ccCkTBL9rCp9RfcQCZA4IoBIAqQBYgxB6b_e8P2GFKLQAqqfWM6QdvY0hDHO0wRsqqNxONHSj6bzP40GfBZcvQr7PXrApT_-SrbOEbisds35ku0clfHrGXxc1zdZcvH2_vq-tlvhFCDDl3TjVcNQZVOQ2zAqHnhFQqsg1KPXdKyUYDlaSU0uhITnSJoFclWqHwiJ3v7n6Z3pl-XbdhjP30sbbd-7ZN26amX1WQk-hEn-3oTQyfI6Wh_vDJUteZnsKYagTOOcIl_gAMllmA</recordid><startdate>20070901</startdate><enddate>20070901</enddate><creator>Guo, Changyou</creator><creator>Zhang, Caibei</creator><creator>He, Lianlong</creator><creator>Jin, Baohong</creator><creator>Shi, Nanlin</creator><general>Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences,Shenyang 110016, China%College of Sciences, Northeastern University, Shenyang 110004, China%Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences,Shenyang 110016, China%Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China</general><general>College of Sciences, Northeastern University, Shenyang 110004, China</general><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>2B.</scope><scope>4A8</scope><scope>92I</scope><scope>93N</scope><scope>PSX</scope><scope>TCJ</scope></search><sort><creationdate>20070901</creationdate><title>Microstructure Characterization of Long W Core SiC Fiber</title><author>Guo, Changyou ; Zhang, Caibei ; He, Lianlong ; Jin, Baohong ; Shi, Nanlin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p222t-1ff7b17ba379ba3ad0286e3e97ecb3586f775b80e9e77783fe517b9308d93c273</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Guo, Changyou</creatorcontrib><creatorcontrib>Zhang, Caibei</creatorcontrib><creatorcontrib>He, Lianlong</creatorcontrib><creatorcontrib>Jin, Baohong</creatorcontrib><creatorcontrib>Shi, Nanlin</creatorcontrib><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Wanfang Data Journals - Hong Kong</collection><collection>WANFANG Data Centre</collection><collection>Wanfang Data Journals</collection><collection>万方数据期刊 - 香港版</collection><collection>China Online Journals (COJ)</collection><collection>China Online Journals (COJ)</collection><jtitle>Journal of materials science &amp; technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Guo, Changyou</au><au>Zhang, Caibei</au><au>He, Lianlong</au><au>Jin, Baohong</au><au>Shi, Nanlin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Microstructure Characterization of Long W Core SiC Fiber</atitle><jtitle>Journal of materials science &amp; technology</jtitle><date>2007-09-01</date><risdate>2007</risdate><volume>23</volume><issue>5</issue><spage>677</spage><epage>684</epage><pages>677-684</pages><issn>1005-0302</issn><abstract>Microstructure of SiC fiber manufactured by chemical vapor deposition (CVD) onto tungsten (W) wire core was investigated by analytical electron microscopy (AEM). The results reveal that the fiber consists of W core, SiC sheath and C-coating. SiC sheath could be subdivided into two parts according to whether containing C rich stripe, or not. An emphasis was put on W/SiC interfacial reaction products and the transition zone between sub-layers in SiC sheath. The W/SiC interface consists of three layers of reaction production, namely, W2 C, W5Si3 and WC. And there are amounts of facet faults existing in (100) face of WC crystalline and two classes of stack faults in WC have been revealed. The formation essence of different sublayers in SiC sheath was also discussed.</abstract><pub>Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences,Shenyang 110016, China%College of Sciences, Northeastern University, Shenyang 110004, China%Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences,Shenyang 110016, China%Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China</pub><doi>10.3321/j.issn:1005-0302.2007.05.022</doi><tpages>8</tpages></addata></record>
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title Microstructure Characterization of Long W Core SiC Fiber
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T22%3A16%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-wanfang_jour_proqu&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Microstructure%20Characterization%20of%20Long%20W%20Core%20SiC%20Fiber&rft.jtitle=Journal%20of%20materials%20science%20&%20technology&rft.au=Guo,%20Changyou&rft.date=2007-09-01&rft.volume=23&rft.issue=5&rft.spage=677&rft.epage=684&rft.pages=677-684&rft.issn=1005-0302&rft_id=info:doi/10.3321/j.issn:1005-0302.2007.05.022&rft_dat=%3Cwanfang_jour_proqu%3Eclkxjsxb_e200705022%3C/wanfang_jour_proqu%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=30111304&rft_id=info:pmid/&rft_wanfj_id=clkxjsxb_e200705022&rfr_iscdi=true