Beam imaging sensor and method for using same
The present invention relates generally to the field of sensors for beam imaging and, in particular, to a new and useful beam imaging sensor for use in determining, for example, the power density distribution of a beam including, but not limited to, an electron beam or an ion beam. In one embodiment...
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| creator | BWXT Nuclear Operations Group, Inc |
| description | The present invention relates generally to the field of sensors for beam imaging and, in particular, to a new and useful beam imaging sensor for use in determining, for example, the power density distribution of a beam including, but not limited to, an electron beam or an ion beam. In one embodiment, the beam imaging sensor of the present invention comprises, among other items, a circumferential slit that is either circular, elliptical or polygonal in nature. In another embodiment, the beam imaging sensor of the present invention comprises, among other things, a discontinuous partially circumferential slit. Also disclosed is a method for using the various beams sensor embodiments of the present invention. |
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In one embodiment, the beam imaging sensor of the present invention comprises, among other items, a circumferential slit that is either circular, elliptical or polygonal in nature. In another embodiment, the beam imaging sensor of the present invention comprises, among other things, a discontinuous partially circumferential slit. 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In one embodiment, the beam imaging sensor of the present invention comprises, among other items, a circumferential slit that is either circular, elliptical or polygonal in nature. In another embodiment, the beam imaging sensor of the present invention comprises, among other things, a discontinuous partially circumferential slit. Also disclosed is a method for using the various beams sensor embodiments of the present invention.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZNB1Sk3MVcjMTUzPzEtXKE7NK84vUkjMS1HITS3JyE9RSANyS4vBcom5qTwMrGmJOcWpvFCam0HBzTXE2UO3tLggsSQ1r6Q4Pr0oEUQZWJoamxoaGBgToQQAZicqgg</recordid><startdate>20170103</startdate><enddate>20170103</enddate><creator>BWXT Nuclear Operations Group, Inc</creator><scope>EFH</scope></search><sort><creationdate>20170103</creationdate><title>Beam imaging sensor and method for using same</title></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_095351003</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2017</creationdate><toplevel>online_resources</toplevel><creatorcontrib>BWXT Nuclear Operations Group, Inc</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><aucorp>BWXT Nuclear Operations Group, Inc</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Beam imaging sensor and method for using same</title><date>2017-01-03</date><risdate>2017</risdate><abstract>The present invention relates generally to the field of sensors for beam imaging and, in particular, to a new and useful beam imaging sensor for use in determining, for example, the power density distribution of a beam including, but not limited to, an electron beam or an ion beam. In one embodiment, the beam imaging sensor of the present invention comprises, among other items, a circumferential slit that is either circular, elliptical or polygonal in nature. In another embodiment, the beam imaging sensor of the present invention comprises, among other things, a discontinuous partially circumferential slit. Also disclosed is a method for using the various beams sensor embodiments of the present invention.</abstract><oa>free_for_read</oa></addata></record> |
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| source | USPTO Issued Patents |
| title | Beam imaging sensor and method for using same |
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