SRAM bitcell data retention control for leakage optimization
An integrated circuit includes a static random access memory (SRAM) array coupled to a first voltage supply node and a second voltage supply node. The first and second voltage supply nodes provide a retention voltage across the SRAM array. A current limiter is disposed between the SRAM array and the...
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creator | Tang, Yukit Hsu, Kuoyuan |
description | An integrated circuit includes a static random access memory (SRAM) array coupled to a first voltage supply node and a second voltage supply node. The first and second voltage supply nodes provide a retention voltage across the SRAM array. A current limiter is disposed between the SRAM array and the first voltage supply node, and a voltage regulator is coupled in parallel with the current limiter between the SRAM array and the first voltage supply node. The voltage regulator is configured to maintain the retention voltage across the SRAM array above a predetermined level. |
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fullrecord | <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_08351279</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>08351279</sourcerecordid><originalsourceid>FETCH-uspatents_grants_083512793</originalsourceid><addsrcrecordid>eNrjZLAJDnL0VUjKLElOzclRSEksSVQoSi1JzSvJzM9TSM7PKynKz1FIyy9SyElNzE5MT1XILyjJzM2sSgQp4GFgTUvMKU7lhdLcDApuriHOHrqlxQWJIEOK49OLEkGUgYWxqaGRuaUxEUoAm0kwtA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SRAM bitcell data retention control for leakage optimization</title><source>USPTO Issued Patents</source><creator>Tang, Yukit ; Hsu, Kuoyuan</creator><creatorcontrib>Tang, Yukit ; Hsu, Kuoyuan ; Taiwan Semiconductor Manufacturing Co., Ltd</creatorcontrib><description>An integrated circuit includes a static random access memory (SRAM) array coupled to a first voltage supply node and a second voltage supply node. The first and second voltage supply nodes provide a retention voltage across the SRAM array. A current limiter is disposed between the SRAM array and the first voltage supply node, and a voltage regulator is coupled in parallel with the current limiter between the SRAM array and the first voltage supply node. The voltage regulator is configured to maintain the retention voltage across the SRAM array above a predetermined level.</description><language>eng</language><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8351279$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64012</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8351279$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Tang, Yukit</creatorcontrib><creatorcontrib>Hsu, Kuoyuan</creatorcontrib><creatorcontrib>Taiwan Semiconductor Manufacturing Co., Ltd</creatorcontrib><title>SRAM bitcell data retention control for leakage optimization</title><description>An integrated circuit includes a static random access memory (SRAM) array coupled to a first voltage supply node and a second voltage supply node. The first and second voltage supply nodes provide a retention voltage across the SRAM array. A current limiter is disposed between the SRAM array and the first voltage supply node, and a voltage regulator is coupled in parallel with the current limiter between the SRAM array and the first voltage supply node. The voltage regulator is configured to maintain the retention voltage across the SRAM array above a predetermined level.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZLAJDnL0VUjKLElOzclRSEksSVQoSi1JzSvJzM9TSM7PKynKz1FIyy9SyElNzE5MT1XILyjJzM2sSgQp4GFgTUvMKU7lhdLcDApuriHOHrqlxQWJIEOK49OLEkGUgYWxqaGRuaUxEUoAm0kwtA</recordid><startdate>20130108</startdate><enddate>20130108</enddate><creator>Tang, Yukit</creator><creator>Hsu, Kuoyuan</creator><scope>EFH</scope></search><sort><creationdate>20130108</creationdate><title>SRAM bitcell data retention control for leakage optimization</title><author>Tang, Yukit ; Hsu, Kuoyuan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_083512793</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2013</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Tang, Yukit</creatorcontrib><creatorcontrib>Hsu, Kuoyuan</creatorcontrib><creatorcontrib>Taiwan Semiconductor Manufacturing Co., Ltd</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Tang, Yukit</au><au>Hsu, Kuoyuan</au><aucorp>Taiwan Semiconductor Manufacturing Co., Ltd</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SRAM bitcell data retention control for leakage optimization</title><date>2013-01-08</date><risdate>2013</risdate><abstract>An integrated circuit includes a static random access memory (SRAM) array coupled to a first voltage supply node and a second voltage supply node. The first and second voltage supply nodes provide a retention voltage across the SRAM array. A current limiter is disposed between the SRAM array and the first voltage supply node, and a voltage regulator is coupled in parallel with the current limiter between the SRAM array and the first voltage supply node. The voltage regulator is configured to maintain the retention voltage across the SRAM array above a predetermined level.</abstract><oa>free_for_read</oa></addata></record> |
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title | SRAM bitcell data retention control for leakage optimization |
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