Self-aligned silicide formation on source/drain through contact via

According to certain embodiments, a silicide layer is formed after the fabrication of a functional gate electrode using a gate-last scheme. An initial semiconductor structure has at least one impurity regions formed on a semiconductor substrate, a sacrifice film formed over the impurity region, an i...

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Bibliographische Detailangaben
1. Verfasser: Uozumi, Yoshihiro
Format: Patent
Sprache:eng
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