Monitoring a process sector in a production facility

Monitoring a process sector in a production facility includes establishing a tool defect index associated with a process sector in the production facility. The tool defect index includes a signal representing a defect factor associated with a tool in the process sector. Monitoring the process also r...

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Hauptverfasser: Cote, William, Guse, Michael P, Lagus, Mark E, Rice, James, Song, Yunsheng
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Sprache:eng
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creator Cote, William
Guse, Michael P
Lagus, Mark E
Rice, James
Song, Yunsheng
description Monitoring a process sector in a production facility includes establishing a tool defect index associated with a process sector in the production facility. The tool defect index includes a signal representing a defect factor associated with a tool in the process sector. Monitoring the process also requires determining whether the defect factor is a known defect factor or an unknown defect factor, and analyzing a unit from the tool if the defect factor is an unknown defect factor. Monitoring the process further requires identifying at least one defect on the unit from the tool, establishing that the at least one defect is a significant defect, determining cause of the significant defect, and creating an alert indicating that the tool associated with the process sector is producing units having significant defects.
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fullrecord <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_08340800</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>08340800</sourcerecordid><originalsourceid>FETCH-uspatents_grants_083408003</originalsourceid><addsrcrecordid>eNrjZDDxzc_LLMkvysxLV0hUKCjKT04tLlYoTk0Giilk5kHEUkqTSzLz8xTSEpMzczJLKnkYWNMSc4pTeaE0N4OCm2uIs4duaXFBYklqXklxfHpRIogysDA2MbAwMDAmQgkAD1ktwQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Monitoring a process sector in a production facility</title><source>USPTO Issued Patents</source><creator>Cote, William ; Guse, Michael P ; Lagus, Mark E ; Rice, James ; Song, Yunsheng</creator><creatorcontrib>Cote, William ; Guse, Michael P ; Lagus, Mark E ; Rice, James ; Song, Yunsheng ; International Business Machines Corporation</creatorcontrib><description>Monitoring a process sector in a production facility includes establishing a tool defect index associated with a process sector in the production facility. The tool defect index includes a signal representing a defect factor associated with a tool in the process sector. Monitoring the process also requires determining whether the defect factor is a known defect factor or an unknown defect factor, and analyzing a unit from the tool if the defect factor is an unknown defect factor. Monitoring the process further requires identifying at least one defect on the unit from the tool, establishing that the at least one defect is a significant defect, determining cause of the significant defect, and creating an alert indicating that the tool associated with the process sector is producing units having significant defects.</description><language>eng</language><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8340800$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64012</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8340800$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Cote, William</creatorcontrib><creatorcontrib>Guse, Michael P</creatorcontrib><creatorcontrib>Lagus, Mark E</creatorcontrib><creatorcontrib>Rice, James</creatorcontrib><creatorcontrib>Song, Yunsheng</creatorcontrib><creatorcontrib>International Business Machines Corporation</creatorcontrib><title>Monitoring a process sector in a production facility</title><description>Monitoring a process sector in a production facility includes establishing a tool defect index associated with a process sector in the production facility. The tool defect index includes a signal representing a defect factor associated with a tool in the process sector. Monitoring the process also requires determining whether the defect factor is a known defect factor or an unknown defect factor, and analyzing a unit from the tool if the defect factor is an unknown defect factor. Monitoring the process further requires identifying at least one defect on the unit from the tool, establishing that the at least one defect is a significant defect, determining cause of the significant defect, and creating an alert indicating that the tool associated with the process sector is producing units having significant defects.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZDDxzc_LLMkvysxLV0hUKCjKT04tLlYoTk0Giilk5kHEUkqTSzLz8xTSEpMzczJLKnkYWNMSc4pTeaE0N4OCm2uIs4duaXFBYklqXklxfHpRIogysDA2MbAwMDAmQgkAD1ktwQ</recordid><startdate>20121225</startdate><enddate>20121225</enddate><creator>Cote, William</creator><creator>Guse, Michael P</creator><creator>Lagus, Mark E</creator><creator>Rice, James</creator><creator>Song, Yunsheng</creator><scope>EFH</scope></search><sort><creationdate>20121225</creationdate><title>Monitoring a process sector in a production facility</title><author>Cote, William ; Guse, Michael P ; Lagus, Mark E ; Rice, James ; Song, Yunsheng</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_083408003</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2012</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Cote, William</creatorcontrib><creatorcontrib>Guse, Michael P</creatorcontrib><creatorcontrib>Lagus, Mark E</creatorcontrib><creatorcontrib>Rice, James</creatorcontrib><creatorcontrib>Song, Yunsheng</creatorcontrib><creatorcontrib>International Business Machines Corporation</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Cote, William</au><au>Guse, Michael P</au><au>Lagus, Mark E</au><au>Rice, James</au><au>Song, Yunsheng</au><aucorp>International Business Machines Corporation</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Monitoring a process sector in a production facility</title><date>2012-12-25</date><risdate>2012</risdate><abstract>Monitoring a process sector in a production facility includes establishing a tool defect index associated with a process sector in the production facility. The tool defect index includes a signal representing a defect factor associated with a tool in the process sector. Monitoring the process also requires determining whether the defect factor is a known defect factor or an unknown defect factor, and analyzing a unit from the tool if the defect factor is an unknown defect factor. Monitoring the process further requires identifying at least one defect on the unit from the tool, establishing that the at least one defect is a significant defect, determining cause of the significant defect, and creating an alert indicating that the tool associated with the process sector is producing units having significant defects.</abstract><oa>free_for_read</oa></addata></record>
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title Monitoring a process sector in a production facility
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T18%3A03%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Cote,%20William&rft.aucorp=International%20Business%20Machines%20Corporation&rft.date=2012-12-25&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E08340800%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true