Method for manufacturing semiconductor device

Suppression of generation of a stripe pattern (unevenness) when an SOI substrate is manufactured by a glass substrate and a single crystal semiconductor substrate bonded to each other. A single crystal semiconductor substrate is irradiated with ions so that a fragile region is formed in the single c...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: Makino, Kenichiro
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
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