Complementary semiconductor device with a metal oxide layer exclusive to one conductivity type

A method is provided of manufacturing a semiconductor device comprising a first, n-type field effect transistor and a second, p-type field effect transistor. The method comprises depositing a gate dielectric layer over a substrate; depositing a gate metal layer over the gate dielectric layer, deposi...

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Bibliographische Detailangaben
1. Verfasser: Hooker, Jacob C
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
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