Enhanced thermal management for improved module reliability

Enhanced thermal management for improved module reliability

Mitigating effects of delamination of components in the data processing system is provided. A signal is received from one or more sensors in the data processing system. A determination is made as to whether the signal indicates that one threshold in a plurality of thresholds has been reached or exce...

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Hauptverfasser: Casey, Jon A, Floyd, Michael S, Ghiasi, Soraya, Marston, Kenneth C, Muncy, Jennifer V, Ware, Malcolm S, Weekly, Roger D
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Sprache:eng
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creator Casey, Jon A
Floyd, Michael S
Ghiasi, Soraya
Marston, Kenneth C
Muncy, Jennifer V
Ware, Malcolm S
Weekly, Roger D
description Mitigating effects of delamination of components in the data processing system is provided. A signal is received from one or more sensors in the data processing system. A determination is made as to whether the signal indicates that one threshold in a plurality of thresholds has been reached or exceeded. Responsive to the signal indicating that one threshold in the plurality of thresholds has been reached or exceeded, a determination is made as to whether the one threshold is a low temperature threshold or a high temperature threshold. Responsive to the one threshold being a low temperature threshold, one of a plurality of actions is initiated to increase a temperature of the data processing system thereby mitigating effects of delamination of the components in the data processing system.
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fullrecord <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_08214658</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>08214658</sourcerecordid><originalsourceid>FETCH-uspatents_grants_082146583</originalsourceid><addsrcrecordid>eNrjZLB2zctIzEtOTVEoyUgtyk3MUchNzEtMT81NzStRSMsvUsjMLSjKLwPK5-anlOakKhSl5mQmJmXmZJZU8jCwpiXmFKfyQmluBgU31xBnD93S4oLEEqABxfHpRYkgysDCyNDEzNTCmAglAKRQMME</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Enhanced thermal management for improved module reliability</title><source>USPTO Issued Patents</source><creator>Casey, Jon A ; Floyd, Michael S ; Ghiasi, Soraya ; Marston, Kenneth C ; Muncy, Jennifer V ; Ware, Malcolm S ; Weekly, Roger D</creator><creatorcontrib>Casey, Jon A ; Floyd, Michael S ; Ghiasi, Soraya ; Marston, Kenneth C ; Muncy, Jennifer V ; Ware, Malcolm S ; Weekly, Roger D ; International Business Machines Corporation</creatorcontrib><description>Mitigating effects of delamination of components in the data processing system is provided. A signal is received from one or more sensors in the data processing system. A determination is made as to whether the signal indicates that one threshold in a plurality of thresholds has been reached or exceeded. Responsive to the signal indicating that one threshold in the plurality of thresholds has been reached or exceeded, a determination is made as to whether the one threshold is a low temperature threshold or a high temperature threshold. Responsive to the one threshold being a low temperature threshold, one of a plurality of actions is initiated to increase a temperature of the data processing system thereby mitigating effects of delamination of the components in the data processing system.</description><language>eng</language><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8214658$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,780,802,885,64037</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8214658$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Casey, Jon A</creatorcontrib><creatorcontrib>Floyd, Michael S</creatorcontrib><creatorcontrib>Ghiasi, Soraya</creatorcontrib><creatorcontrib>Marston, Kenneth C</creatorcontrib><creatorcontrib>Muncy, Jennifer V</creatorcontrib><creatorcontrib>Ware, Malcolm S</creatorcontrib><creatorcontrib>Weekly, Roger D</creatorcontrib><creatorcontrib>International Business Machines Corporation</creatorcontrib><title>Enhanced thermal management for improved module reliability</title><description>Mitigating effects of delamination of components in the data processing system is provided. A signal is received from one or more sensors in the data processing system. A determination is made as to whether the signal indicates that one threshold in a plurality of thresholds has been reached or exceeded. Responsive to the signal indicating that one threshold in the plurality of thresholds has been reached or exceeded, a determination is made as to whether the one threshold is a low temperature threshold or a high temperature threshold. Responsive to the one threshold being a low temperature threshold, one of a plurality of actions is initiated to increase a temperature of the data processing system thereby mitigating effects of delamination of the components in the data processing system.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZLB2zctIzEtOTVEoyUgtyk3MUchNzEtMT81NzStRSMsvUsjMLSjKLwPK5-anlOakKhSl5mQmJmXmZJZU8jCwpiXmFKfyQmluBgU31xBnD93S4oLEEqABxfHpRYkgysDCyNDEzNTCmAglAKRQMME</recordid><startdate>20120703</startdate><enddate>20120703</enddate><creator>Casey, Jon A</creator><creator>Floyd, Michael S</creator><creator>Ghiasi, Soraya</creator><creator>Marston, Kenneth C</creator><creator>Muncy, Jennifer V</creator><creator>Ware, Malcolm S</creator><creator>Weekly, Roger D</creator><scope>EFH</scope></search><sort><creationdate>20120703</creationdate><title>Enhanced thermal management for improved module reliability</title><author>Casey, Jon A ; Floyd, Michael S ; Ghiasi, Soraya ; Marston, Kenneth C ; Muncy, Jennifer V ; Ware, Malcolm S ; Weekly, Roger D</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_082146583</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2012</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Casey, Jon A</creatorcontrib><creatorcontrib>Floyd, Michael S</creatorcontrib><creatorcontrib>Ghiasi, Soraya</creatorcontrib><creatorcontrib>Marston, Kenneth C</creatorcontrib><creatorcontrib>Muncy, Jennifer V</creatorcontrib><creatorcontrib>Ware, Malcolm S</creatorcontrib><creatorcontrib>Weekly, Roger D</creatorcontrib><creatorcontrib>International Business Machines Corporation</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Casey, Jon A</au><au>Floyd, Michael S</au><au>Ghiasi, Soraya</au><au>Marston, Kenneth C</au><au>Muncy, Jennifer V</au><au>Ware, Malcolm S</au><au>Weekly, Roger D</au><aucorp>International Business Machines Corporation</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Enhanced thermal management for improved module reliability</title><date>2012-07-03</date><risdate>2012</risdate><abstract>Mitigating effects of delamination of components in the data processing system is provided. A signal is received from one or more sensors in the data processing system. A determination is made as to whether the signal indicates that one threshold in a plurality of thresholds has been reached or exceeded. Responsive to the signal indicating that one threshold in the plurality of thresholds has been reached or exceeded, a determination is made as to whether the one threshold is a low temperature threshold or a high temperature threshold. Responsive to the one threshold being a low temperature threshold, one of a plurality of actions is initiated to increase a temperature of the data processing system thereby mitigating effects of delamination of the components in the data processing system.</abstract><oa>free_for_read</oa></addata></record>
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title Enhanced thermal management for improved module reliability
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T23%3A59%3A37IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Casey,%20Jon%20A&rft.aucorp=International%20Business%20Machines%20Corporation&rft.date=2012-07-03&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E08214658%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true