Method and apparatus for self-regulated burn-in of an integrated circuit

Method and apparatus for self-regulated burn-in of an integrated circuit

Method and apparatus for self-regulated burn-in of an integrated circuit (IC) is described. One embodiment of a method of burn-in for the IC includes: configuring programmable resources of the IC device based on a burn-in pattern to implement a load controller, the load controller having a plurality...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Cho, Jae, O'Rourke, Glenn, Matera, Michael M, Jeong, Jongheon
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Cho, Jae
O'Rourke, Glenn
Matera, Michael M
Jeong, Jongheon
description Method and apparatus for self-regulated burn-in of an integrated circuit (IC) is described. One embodiment of a method of burn-in for the IC includes: configuring programmable resources of the IC device based on a burn-in pattern to implement a load controller, the load controller having a plurality of heat core circuits. The load controller is initialized with a number of enabled heat core circuits of the plurality of heat core circuits. A junction temperature is measured in the IC device after a measurement period has elapsed. The junction temperature is compared with a set-point temperature. The number of the enabled heat core circuits is increased if the junction temperature is less than the set-point temperature, or the number of the enabled heat core circuits is decreased if the junction temperature is greater than the set-point temperature.
format Patent
fullrecord <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_08212576</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>08212576</sourcerecordid><originalsourceid>FETCH-uspatents_grants_082125763</originalsourceid><addsrcrecordid>eNrjZPDwTS3JyE9RSMwD4oKCxKLEktJihbT8IoXi1Jw03aLU9NKcxJLUFIWk0qI83cw8hfw0oFqFzLyS1PQisERyZlFyaWYJDwNrWmJOcSovlOZmUHBzDXH20C0tLgCqyyspjgdqAFEGFkaGRqbmZsZEKAEARa009A</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method and apparatus for self-regulated burn-in of an integrated circuit</title><source>USPTO Issued Patents</source><creator>Cho, Jae ; O'Rourke, Glenn ; Matera, Michael M ; Jeong, Jongheon</creator><creatorcontrib>Cho, Jae ; O'Rourke, Glenn ; Matera, Michael M ; Jeong, Jongheon ; Xilinx, Inc</creatorcontrib><description>Method and apparatus for self-regulated burn-in of an integrated circuit (IC) is described. One embodiment of a method of burn-in for the IC includes: configuring programmable resources of the IC device based on a burn-in pattern to implement a load controller, the load controller having a plurality of heat core circuits. The load controller is initialized with a number of enabled heat core circuits of the plurality of heat core circuits. A junction temperature is measured in the IC device after a measurement period has elapsed. The junction temperature is compared with a set-point temperature. The number of the enabled heat core circuits is increased if the junction temperature is less than the set-point temperature, or the number of the enabled heat core circuits is decreased if the junction temperature is greater than the set-point temperature.</description><language>eng</language><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8212576$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64015</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8212576$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Cho, Jae</creatorcontrib><creatorcontrib>O'Rourke, Glenn</creatorcontrib><creatorcontrib>Matera, Michael M</creatorcontrib><creatorcontrib>Jeong, Jongheon</creatorcontrib><creatorcontrib>Xilinx, Inc</creatorcontrib><title>Method and apparatus for self-regulated burn-in of an integrated circuit</title><description>Method and apparatus for self-regulated burn-in of an integrated circuit (IC) is described. One embodiment of a method of burn-in for the IC includes: configuring programmable resources of the IC device based on a burn-in pattern to implement a load controller, the load controller having a plurality of heat core circuits. The load controller is initialized with a number of enabled heat core circuits of the plurality of heat core circuits. A junction temperature is measured in the IC device after a measurement period has elapsed. The junction temperature is compared with a set-point temperature. The number of the enabled heat core circuits is increased if the junction temperature is less than the set-point temperature, or the number of the enabled heat core circuits is decreased if the junction temperature is greater than the set-point temperature.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZPDwTS3JyE9RSMwD4oKCxKLEktJihbT8IoXi1Jw03aLU9NKcxJLUFIWk0qI83cw8hfw0oFqFzLyS1PQisERyZlFyaWYJDwNrWmJOcSovlOZmUHBzDXH20C0tLgCqyyspjgdqAFEGFkaGRqbmZsZEKAEARa009A</recordid><startdate>20120703</startdate><enddate>20120703</enddate><creator>Cho, Jae</creator><creator>O'Rourke, Glenn</creator><creator>Matera, Michael M</creator><creator>Jeong, Jongheon</creator><scope>EFH</scope></search><sort><creationdate>20120703</creationdate><title>Method and apparatus for self-regulated burn-in of an integrated circuit</title><author>Cho, Jae ; O'Rourke, Glenn ; Matera, Michael M ; Jeong, Jongheon</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_082125763</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2012</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Cho, Jae</creatorcontrib><creatorcontrib>O'Rourke, Glenn</creatorcontrib><creatorcontrib>Matera, Michael M</creatorcontrib><creatorcontrib>Jeong, Jongheon</creatorcontrib><creatorcontrib>Xilinx, Inc</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Cho, Jae</au><au>O'Rourke, Glenn</au><au>Matera, Michael M</au><au>Jeong, Jongheon</au><aucorp>Xilinx, Inc</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method and apparatus for self-regulated burn-in of an integrated circuit</title><date>2012-07-03</date><risdate>2012</risdate><abstract>Method and apparatus for self-regulated burn-in of an integrated circuit (IC) is described. One embodiment of a method of burn-in for the IC includes: configuring programmable resources of the IC device based on a burn-in pattern to implement a load controller, the load controller having a plurality of heat core circuits. The load controller is initialized with a number of enabled heat core circuits of the plurality of heat core circuits. A junction temperature is measured in the IC device after a measurement period has elapsed. The junction temperature is compared with a set-point temperature. The number of the enabled heat core circuits is increased if the junction temperature is less than the set-point temperature, or the number of the enabled heat core circuits is decreased if the junction temperature is greater than the set-point temperature.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_uspatents_grants_08212576
source USPTO Issued Patents
title Method and apparatus for self-regulated burn-in of an integrated circuit
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T03%3A46%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Cho,%20Jae&rft.aucorp=Xilinx,%20Inc&rft.date=2012-07-03&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E08212576%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true