Method of eliminating micro-trenches during spacer etch

A method of forming a semiconductor structure is provided. The method includes providing a semiconductor substrate with a substrate region. The method also includes forming a pad oxide layer overlying the substrate region. The method additionally includes forming a stop layer overlying the pad oxide...

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Bibliographische Detailangaben
1. Verfasser: Ang, Ting Cheong
Format: Patent
Sprache:eng
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