Optical apparatus for defect inspection

An optical apparatus for defect inspection having an illuminating optical system for irradiating illumination light beams on the surface of a specimen to form a beam spot and a detection optical system for detecting a reflection light ray originating from the beam spot comprises a storage unit in wh...

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Bibliographische Detailangaben
Hauptverfasser: Otani, Seiji, Nagoya, Koichi
Format: Patent
Sprache:eng
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