X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic
An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple gr...
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| Format: | Patent |
| Sprache: | eng |
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