Method and system for selective stress enablement in simulation modeling
A method and system for modeling an integrated circuit. The method includes converting a representation of the integrated circuit into design shapes of design levels of a design of the integrated circuit; adding control shapes to the design, the control shapes not defining any physical part of the i...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | A method and system for modeling an integrated circuit. The method includes converting a representation of the integrated circuit into design shapes of design levels of a design of the integrated circuit; adding control shapes to the design, the control shapes not defining any physical part of the integrated circuit; extracting layout-dependent stress parameters of the devices from the design levels of the design based on the control shapes and the design shapes; converting the layout-dependent stress parameters to stress parameters using a stress algorithm; generating stressed device parameters from the stress parameters using a compact model; and simulating performance of the integrated circuit using the stressed device parameters in a simulation model of the integrated circuit design. |
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