Memory block testing

A memory block of a memory device is tested by programming a plurality of pages of the memory block, passing the memory block if a number of pages, each programmed in a first programming time, is greater than or equal to a first predetermined number and a number of pages, each programmed in a second...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Gatzemeier, Scott N, Sinipete, Joemar, Gajera, Nevil, Hawes, Mark
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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