Test method and system for characterizing and/or refining an IC design cycle

Systems and methods are provided for refining a design cycle for an integrated circuit. An integrated circuit design is generated. A plurality of non-critical paths within the integrated circuit design are identified. A set of at least one of the plurality of non-critical paths is modified to produc...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Bittlestone, Clive D, Butler, Kenneth M, Mason, Mark E, Butler, Stephanie Watts
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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