Test method and system for characterizing and/or refining an IC design cycle

Test method and system for characterizing and/or refining an IC design cycle

Systems and methods are provided for refining a design cycle for an integrated circuit. An integrated circuit design is generated. A plurality of non-critical paths within the integrated circuit design are identified. A set of at least one of the plurality of non-critical paths is modified to produc...

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Hauptverfasser: Bittlestone, Clive D, Butler, Kenneth M, Mason, Mark E, Butler, Stephanie Watts
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Sprache:eng
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creator Bittlestone, Clive D
Butler, Kenneth M
Mason, Mark E
Butler, Stephanie Watts
description Systems and methods are provided for refining a design cycle for an integrated circuit. An integrated circuit design is generated. A plurality of non-critical paths within the integrated circuit design are identified. A set of at least one of the plurality of non-critical paths is modified to produce a modified design in which the sensitivity of each of the set of non-critical paths to at least one parameter is enhanced. Each parameter is either a design parameter or a process parameter. An integrated circuit is fabricated according to the modified design. The fabricated integrated circuit is evaluated to measure a set of timing data representing each of the plurality of non-critical paths. The value of the parameter is determined from the measured set of timing data.
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title Test method and system for characterizing and/or refining an IC design cycle
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