Semiconductor inspecting apparatus

A semiconductor inspecting apparatus includes: a buffer memory whose width is matched to the greater of parallel bus width and the width of the number of serial lanes; a preceding stage bus switching unit that fills the buffer memory with input data without making a free space; equivalent transmissi...

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Bibliographische Detailangaben

Hauptverfasser:	Sakurai, Yuichi, Toba, Tadanobu, Kikuchi, Shuji
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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