Reflective processing of TMK hierarchies
A method for the automatic examination of knowledge system hierarchies is disclosed. A target TMK hierarchy is represented as a plurality of records in a database. A second TMK hierarchy (a "critic") is constructed of tasks, subtasks, methods, procedures and actions. The critic hierarchy i...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | Griffith, Todd William Ross, Robert Douglas Rogosky, Brian Joseph Potts, Jason Randolph |
description | A method for the automatic examination of knowledge system hierarchies is disclosed. A target TMK hierarchy is represented as a plurality of records in a database. A second TMK hierarchy (a "critic") is constructed of tasks, subtasks, methods, procedures and actions. The critic hierarchy includes actions that retrieve and examine at least one record of the database representing the target hierarchy. The examination of the record provides a result. The result is of the form of a modification of the processing within the critic hierarchy or of the form of a report or a modification of the target hierarchy's elements, namely, tasks, methods, procedures, actions, class structures, or the relationship between the elements. |
format | Patent |
fullrecord | <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_08019716</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>08019716</sourcerecordid><originalsourceid>FETCH-uspatents_grants_080197163</originalsourceid><addsrcrecordid>eNrjZNAISk3LSU0uySxLVSgoyk9OLS7OzEtXyE9TCPH1VsjITC1KLEoGUsU8DKxpiTnFqbxQmptBwc01xNlDt7S4ILEkNa-kOD69KBFEGVgYGFqaG5oZE6EEAJ5OKQs</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Reflective processing of TMK hierarchies</title><source>USPTO Issued Patents</source><creator>Griffith, Todd William ; Ross, Robert Douglas ; Rogosky, Brian Joseph ; Potts, Jason Randolph</creator><creatorcontrib>Griffith, Todd William ; Ross, Robert Douglas ; Rogosky, Brian Joseph ; Potts, Jason Randolph ; Discovery Machine, Inc</creatorcontrib><description>A method for the automatic examination of knowledge system hierarchies is disclosed. A target TMK hierarchy is represented as a plurality of records in a database. A second TMK hierarchy (a "critic") is constructed of tasks, subtasks, methods, procedures and actions. The critic hierarchy includes actions that retrieve and examine at least one record of the database representing the target hierarchy. The examination of the record provides a result. The result is of the form of a modification of the processing within the critic hierarchy or of the form of a report or a modification of the target hierarchy's elements, namely, tasks, methods, procedures, actions, class structures, or the relationship between the elements.</description><language>eng</language><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8019716$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,780,802,885,64038</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8019716$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Griffith, Todd William</creatorcontrib><creatorcontrib>Ross, Robert Douglas</creatorcontrib><creatorcontrib>Rogosky, Brian Joseph</creatorcontrib><creatorcontrib>Potts, Jason Randolph</creatorcontrib><creatorcontrib>Discovery Machine, Inc</creatorcontrib><title>Reflective processing of TMK hierarchies</title><description>A method for the automatic examination of knowledge system hierarchies is disclosed. A target TMK hierarchy is represented as a plurality of records in a database. A second TMK hierarchy (a "critic") is constructed of tasks, subtasks, methods, procedures and actions. The critic hierarchy includes actions that retrieve and examine at least one record of the database representing the target hierarchy. The examination of the record provides a result. The result is of the form of a modification of the processing within the critic hierarchy or of the form of a report or a modification of the target hierarchy's elements, namely, tasks, methods, procedures, actions, class structures, or the relationship between the elements.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZNAISk3LSU0uySxLVSgoyk9OLS7OzEtXyE9TCPH1VsjITC1KLEoGUsU8DKxpiTnFqbxQmptBwc01xNlDt7S4ILEkNa-kOD69KBFEGVgYGFqaG5oZE6EEAJ5OKQs</recordid><startdate>20110913</startdate><enddate>20110913</enddate><creator>Griffith, Todd William</creator><creator>Ross, Robert Douglas</creator><creator>Rogosky, Brian Joseph</creator><creator>Potts, Jason Randolph</creator><scope>EFH</scope></search><sort><creationdate>20110913</creationdate><title>Reflective processing of TMK hierarchies</title><author>Griffith, Todd William ; Ross, Robert Douglas ; Rogosky, Brian Joseph ; Potts, Jason Randolph</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_080197163</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Griffith, Todd William</creatorcontrib><creatorcontrib>Ross, Robert Douglas</creatorcontrib><creatorcontrib>Rogosky, Brian Joseph</creatorcontrib><creatorcontrib>Potts, Jason Randolph</creatorcontrib><creatorcontrib>Discovery Machine, Inc</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Griffith, Todd William</au><au>Ross, Robert Douglas</au><au>Rogosky, Brian Joseph</au><au>Potts, Jason Randolph</au><aucorp>Discovery Machine, Inc</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Reflective processing of TMK hierarchies</title><date>2011-09-13</date><risdate>2011</risdate><abstract>A method for the automatic examination of knowledge system hierarchies is disclosed. A target TMK hierarchy is represented as a plurality of records in a database. A second TMK hierarchy (a "critic") is constructed of tasks, subtasks, methods, procedures and actions. The critic hierarchy includes actions that retrieve and examine at least one record of the database representing the target hierarchy. The examination of the record provides a result. The result is of the form of a modification of the processing within the critic hierarchy or of the form of a report or a modification of the target hierarchy's elements, namely, tasks, methods, procedures, actions, class structures, or the relationship between the elements.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_uspatents_grants_08019716 |
source | USPTO Issued Patents |
title | Reflective processing of TMK hierarchies |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T16%3A56%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Griffith,%20Todd%20William&rft.aucorp=Discovery%20Machine,%20Inc&rft.date=2011-09-13&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E08019716%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |