Method of producing an epitaxial layer on semiconductor substrate and device produced with such a method
The invention relates to the manufacture of an epitaxial layer, with the following steps: providing a semiconductor substrate; providing a Si-Ge layer on the semiconductor substrate, having a first depth; -providing the semiconductor substrate with a doped layer with an n-type dopant material and ha...
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creator | Meunier-Beillard, Philippe Huizing, Hendrik G. A |
description | The invention relates to the manufacture of an epitaxial layer, with the following steps: providing a semiconductor substrate; providing a Si-Ge layer on the semiconductor substrate, having a first depth; -providing the semiconductor substrate with a doped layer with an n-type dopant material and having a second depth substantially greater than said first depth; performing an oxidation step to form a silicon dioxide layer such that Ge atoms and n-type atoms are pushed into the semiconductor substrate by the silicon dioxide layer at the silicon dioxide/silicon interface, wherein the n-type atoms are pushed deeper into the semiconductor substrate than the Ge atoms, resulting in a top layer with a reduced concentration of n-type atoms; removing the silicon dioxide layer; growing an epitaxial layer of silicon on the semiconductor substrate with a reduced outdiffusion or autodoping. |
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fullrecord | <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_07923339</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>07923339</sourcerecordid><originalsourceid>FETCH-uspatents_grants_079233393</originalsourceid><addsrcrecordid>eNqNzTsOwjAQhGE3FAi4w1wACeECpUZENHT0aLE3sSXHjuwNj9tjUA5A9TefZpbKXVhcskgdxpzsZHzsQRE8eqGXp4BAb85IEYUHb1KsRlJGme5FMglXbWH54Q3PE2zx9OIqMQ6E4fewVouOQuHN3JVCe7oez9upjHUlSrn1mb7ZHZq91rrRf5APvHRBVg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method of producing an epitaxial layer on semiconductor substrate and device produced with such a method</title><source>USPTO Issued Patents</source><creator>Meunier-Beillard, Philippe ; Huizing, Hendrik G. A</creator><creatorcontrib>Meunier-Beillard, Philippe ; Huizing, Hendrik G. A ; NXP B.V</creatorcontrib><description>The invention relates to the manufacture of an epitaxial layer, with the following steps: providing a semiconductor substrate; providing a Si-Ge layer on the semiconductor substrate, having a first depth; -providing the semiconductor substrate with a doped layer with an n-type dopant material and having a second depth substantially greater than said first depth; performing an oxidation step to form a silicon dioxide layer such that Ge atoms and n-type atoms are pushed into the semiconductor substrate by the silicon dioxide layer at the silicon dioxide/silicon interface, wherein the n-type atoms are pushed deeper into the semiconductor substrate than the Ge atoms, resulting in a top layer with a reduced concentration of n-type atoms; removing the silicon dioxide layer; growing an epitaxial layer of silicon on the semiconductor substrate with a reduced outdiffusion or autodoping.</description><language>eng</language><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7923339$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64012</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7923339$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Meunier-Beillard, Philippe</creatorcontrib><creatorcontrib>Huizing, Hendrik G. A</creatorcontrib><creatorcontrib>NXP B.V</creatorcontrib><title>Method of producing an epitaxial layer on semiconductor substrate and device produced with such a method</title><description>The invention relates to the manufacture of an epitaxial layer, with the following steps: providing a semiconductor substrate; providing a Si-Ge layer on the semiconductor substrate, having a first depth; -providing the semiconductor substrate with a doped layer with an n-type dopant material and having a second depth substantially greater than said first depth; performing an oxidation step to form a silicon dioxide layer such that Ge atoms and n-type atoms are pushed into the semiconductor substrate by the silicon dioxide layer at the silicon dioxide/silicon interface, wherein the n-type atoms are pushed deeper into the semiconductor substrate than the Ge atoms, resulting in a top layer with a reduced concentration of n-type atoms; removing the silicon dioxide layer; growing an epitaxial layer of silicon on the semiconductor substrate with a reduced outdiffusion or autodoping.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNqNzTsOwjAQhGE3FAi4w1wACeECpUZENHT0aLE3sSXHjuwNj9tjUA5A9TefZpbKXVhcskgdxpzsZHzsQRE8eqGXp4BAb85IEYUHb1KsRlJGme5FMglXbWH54Q3PE2zx9OIqMQ6E4fewVouOQuHN3JVCe7oez9upjHUlSrn1mb7ZHZq91rrRf5APvHRBVg</recordid><startdate>20110412</startdate><enddate>20110412</enddate><creator>Meunier-Beillard, Philippe</creator><creator>Huizing, Hendrik G. A</creator><scope>EFH</scope></search><sort><creationdate>20110412</creationdate><title>Method of producing an epitaxial layer on semiconductor substrate and device produced with such a method</title><author>Meunier-Beillard, Philippe ; Huizing, Hendrik G. A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_079233393</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Meunier-Beillard, Philippe</creatorcontrib><creatorcontrib>Huizing, Hendrik G. A</creatorcontrib><creatorcontrib>NXP B.V</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Meunier-Beillard, Philippe</au><au>Huizing, Hendrik G. A</au><aucorp>NXP B.V</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method of producing an epitaxial layer on semiconductor substrate and device produced with such a method</title><date>2011-04-12</date><risdate>2011</risdate><abstract>The invention relates to the manufacture of an epitaxial layer, with the following steps: providing a semiconductor substrate; providing a Si-Ge layer on the semiconductor substrate, having a first depth; -providing the semiconductor substrate with a doped layer with an n-type dopant material and having a second depth substantially greater than said first depth; performing an oxidation step to form a silicon dioxide layer such that Ge atoms and n-type atoms are pushed into the semiconductor substrate by the silicon dioxide layer at the silicon dioxide/silicon interface, wherein the n-type atoms are pushed deeper into the semiconductor substrate than the Ge atoms, resulting in a top layer with a reduced concentration of n-type atoms; removing the silicon dioxide layer; growing an epitaxial layer of silicon on the semiconductor substrate with a reduced outdiffusion or autodoping.</abstract><oa>free_for_read</oa></addata></record> |
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title | Method of producing an epitaxial layer on semiconductor substrate and device produced with such a method |
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