Transistor on the basis of new quantum interference effect

A quantum interference transistor comprising a thin metal film having a protrusion and a thin insulating layer between the metal film and protrusion. A potential barrier is formed in the region beneath the protrusion as a result of quantum interference caused by the geometry of the film and protrusi...

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Bibliographische Detailangaben
1. Verfasser: Tavkhelidze, Avto
Format: Patent
Sprache:eng
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