Method for measuring crystallite size with a two-dimensional X-ray diffractometer

Crystallite size in a sample is determined by performing a quantitative γ-profile analysis on a diffraction ring in a two-dimensional X-ray diffraction pattern. In particular, a two-dimensional X-ray diffraction system is first calibrated with a sample having a known crystallite size, crystal struct...

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1. Verfasser:	He, Bob B
Format:	Patent
Sprache:	eng
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