Chuck for holding a device under test

Chuck for holding a device under test

A chuck includes a conductive element that contacts a device under test in a location on the chuck. The chuck includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically...

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Hauptverfasser: Stewart, Craig, Lord, Anthony, Spencer, Jeff, Burcham, Terry, McCann, Peter, Jones, Rod, Dunklee, John, Lesher, Tim, Newton, David
Format: Patent
Sprache:eng
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creator Stewart, Craig
Lord, Anthony
Spencer, Jeff
Burcham, Terry
McCann, Peter
Jones, Rod
Dunklee, John
Lesher, Tim
Newton, David
description A chuck includes a conductive element that contacts a device under test in a location on the chuck. The chuck includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under test supported by the chuck.
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title Chuck for holding a device under test
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