Dynamic mask memory for serial scan testing
A failure mask memory is added to a semiconductor tester. In conjunction with a new failure filter, failures may be ignored or used to update the contents of failure mask memory. Only the first instance of a failure is reported reducing the size of test data logs.
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| creator | Burlison, Phillip D Su, Mei-Mei Frediani, John K |
| description | A failure mask memory is added to a semiconductor tester. In conjunction with a new failure filter, failures may be ignored or used to update the contents of failure mask memory. Only the first instance of a failure is reported reducing the size of test data logs. |
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| recordid | cdi_uspatents_grants_07865788 |
| source | USPTO Issued Patents |
| title | Dynamic mask memory for serial scan testing |
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