Process condition evaluation method for liquid crystal display module

A process condition evaluation method for a liquid crystal display module (LCM) includes: a first step of obtaining a threshold power measuring pattern, an analysis sample for a cell bonding status in an LCD fabrication process, and obtaining a lower substrate sample by separating an upper substrate...

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Hauptverfasser:	Lee, Jeong-Yeop, Choi, Hoon, Choi, Young Seok, Oh, Kwang-Sik
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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