Methods and apparatus for a memory device with self-healing reference bits

Methods and apparatus for a memory device with self-healing reference bits

A memory device, such an MRAM device, includes self-healing reference bits associated with a set of array bits. The memory performs an error detection step (e.g., using an error-correction coding (ECC) algorithm, to detect the presence of a set of errors within the data bits. One of the reference bi...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Wise, Loren J, Andre, Thomas W, Durlam, Mark A, Salter, Eric J
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Wise, Loren J
Andre, Thomas W
Durlam, Mark A
Salter, Eric J
description A memory device, such an MRAM device, includes self-healing reference bits associated with a set of array bits. The memory performs an error detection step (e.g., using an error-correction coding (ECC) algorithm, to detect the presence of a set of errors within the data bits. One of the reference bits is toggled to a different state if an error count is greater than a predetermined threshold. If the set of errors remains unchanged when subsequently read, the reference bit is toggled back to its original state.
format Patent
fullrecord <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_07747926</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>07747926</sourcerecordid><originalsourceid>FETCH-uspatents_grants_077479263</originalsourceid><addsrcrecordid>eNqNyjEKAjEQQNE0FqLeYS6wsKgYrBdlEezsZTSTTSCbhJlZxdur4AGsXvH_3JzOpKE4AcwOsFZk1EnAFwaEkcbCL3D0iHeCZ9QAQsk3gTDFPACTJ6b8abeosjQzj0lo9XNh4Hi4dH0zSUWlrHIdGL-01m7tfr3b_LG8AcAXNcg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Methods and apparatus for a memory device with self-healing reference bits</title><source>USPTO Issued Patents</source><creator>Wise, Loren J ; Andre, Thomas W ; Durlam, Mark A ; Salter, Eric J</creator><creatorcontrib>Wise, Loren J ; Andre, Thomas W ; Durlam, Mark A ; Salter, Eric J ; Everspin Technologies, Inc</creatorcontrib><description>A memory device, such an MRAM device, includes self-healing reference bits associated with a set of array bits. The memory performs an error detection step (e.g., using an error-correction coding (ECC) algorithm, to detect the presence of a set of errors within the data bits. One of the reference bits is toggled to a different state if an error count is greater than a predetermined threshold. If the set of errors remains unchanged when subsequently read, the reference bit is toggled back to its original state.</description><language>eng</language><creationdate>2010</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7747926$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64015</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7747926$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Wise, Loren J</creatorcontrib><creatorcontrib>Andre, Thomas W</creatorcontrib><creatorcontrib>Durlam, Mark A</creatorcontrib><creatorcontrib>Salter, Eric J</creatorcontrib><creatorcontrib>Everspin Technologies, Inc</creatorcontrib><title>Methods and apparatus for a memory device with self-healing reference bits</title><description>A memory device, such an MRAM device, includes self-healing reference bits associated with a set of array bits. The memory performs an error detection step (e.g., using an error-correction coding (ECC) algorithm, to detect the presence of a set of errors within the data bits. One of the reference bits is toggled to a different state if an error count is greater than a predetermined threshold. If the set of errors remains unchanged when subsequently read, the reference bit is toggled back to its original state.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2010</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNqNyjEKAjEQQNE0FqLeYS6wsKgYrBdlEezsZTSTTSCbhJlZxdur4AGsXvH_3JzOpKE4AcwOsFZk1EnAFwaEkcbCL3D0iHeCZ9QAQsk3gTDFPACTJ6b8abeosjQzj0lo9XNh4Hi4dH0zSUWlrHIdGL-01m7tfr3b_LG8AcAXNcg</recordid><startdate>20100629</startdate><enddate>20100629</enddate><creator>Wise, Loren J</creator><creator>Andre, Thomas W</creator><creator>Durlam, Mark A</creator><creator>Salter, Eric J</creator><scope>EFH</scope></search><sort><creationdate>20100629</creationdate><title>Methods and apparatus for a memory device with self-healing reference bits</title><author>Wise, Loren J ; Andre, Thomas W ; Durlam, Mark A ; Salter, Eric J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_077479263</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2010</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Wise, Loren J</creatorcontrib><creatorcontrib>Andre, Thomas W</creatorcontrib><creatorcontrib>Durlam, Mark A</creatorcontrib><creatorcontrib>Salter, Eric J</creatorcontrib><creatorcontrib>Everspin Technologies, Inc</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Wise, Loren J</au><au>Andre, Thomas W</au><au>Durlam, Mark A</au><au>Salter, Eric J</au><aucorp>Everspin Technologies, Inc</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Methods and apparatus for a memory device with self-healing reference bits</title><date>2010-06-29</date><risdate>2010</risdate><abstract>A memory device, such an MRAM device, includes self-healing reference bits associated with a set of array bits. The memory performs an error detection step (e.g., using an error-correction coding (ECC) algorithm, to detect the presence of a set of errors within the data bits. One of the reference bits is toggled to a different state if an error count is greater than a predetermined threshold. If the set of errors remains unchanged when subsequently read, the reference bit is toggled back to its original state.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_uspatents_grants_07747926
source USPTO Issued Patents
title Methods and apparatus for a memory device with self-healing reference bits
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-25T02%3A09%3A50IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Wise,%20Loren%20J&rft.aucorp=Everspin%20Technologies,%20Inc&rft.date=2010-06-29&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E07747926%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true