X-ray source and detector configuration for a non-translational x-ray diffraction system
A system and method for scanning objects using a non-translational x-ray diffraction (XRD) system is disclosed. The system includes a scanning area through which an object to be scanned traverses and a distributed x-ray source having a plurality of focal spot locations. The distributed x-ray source...
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creator | Edic, Peter Michael Harding, Geoffrey De Man, Bruno K. B Strecker, Helmut Rudolf |
description | A system and method for scanning objects using a non-translational x-ray diffraction (XRD) system is disclosed. The system includes a scanning area through which an object to be scanned traverses and a distributed x-ray source having a plurality of focal spot locations. The distributed x-ray source is affixed on the scanning area and is configured to emit x-rays towards the object as a series of parallel x-ray beams. A stationary detector arrangement is affixed on another side of the scanning area generally opposite the distributed x-ray source and is configured to measure a coherent scatter spectra of the x-rays after passing through the object. A data acquisition system (DAS) is connected to the detector arrangement and is configured to measure the coherent scatter spectra, which is utilized to generate XRD data and determine a material composition of at least a portion of the object from the XRD data. |
format | Patent |
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B ; Strecker, Helmut Rudolf ; Morpho Detection, Inc</creatorcontrib><description>A system and method for scanning objects using a non-translational x-ray diffraction (XRD) system is disclosed. The system includes a scanning area through which an object to be scanned traverses and a distributed x-ray source having a plurality of focal spot locations. The distributed x-ray source is affixed on the scanning area and is configured to emit x-rays towards the object as a series of parallel x-ray beams. A stationary detector arrangement is affixed on another side of the scanning area generally opposite the distributed x-ray source and is configured to measure a coherent scatter spectra of the x-rays after passing through the object. 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B</creatorcontrib><creatorcontrib>Strecker, Helmut Rudolf</creatorcontrib><creatorcontrib>Morpho Detection, Inc</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Edic, Peter Michael</au><au>Harding, Geoffrey</au><au>De Man, Bruno K. B</au><au>Strecker, Helmut Rudolf</au><aucorp>Morpho Detection, Inc</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>X-ray source and detector configuration for a non-translational x-ray diffraction system</title><date>2010-06-22</date><risdate>2010</risdate><abstract>A system and method for scanning objects using a non-translational x-ray diffraction (XRD) system is disclosed. The system includes a scanning area through which an object to be scanned traverses and a distributed x-ray source having a plurality of focal spot locations. The distributed x-ray source is affixed on the scanning area and is configured to emit x-rays towards the object as a series of parallel x-ray beams. A stationary detector arrangement is affixed on another side of the scanning area generally opposite the distributed x-ray source and is configured to measure a coherent scatter spectra of the x-rays after passing through the object. A data acquisition system (DAS) is connected to the detector arrangement and is configured to measure the coherent scatter spectra, which is utilized to generate XRD data and determine a material composition of at least a portion of the object from the XRD data.</abstract><oa>free_for_read</oa></addata></record> |
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title | X-ray source and detector configuration for a non-translational x-ray diffraction system |
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