X-ray source and detector configuration for a non-translational x-ray diffraction system

A system and method for scanning objects using a non-translational x-ray diffraction (XRD) system is disclosed. The system includes a scanning area through which an object to be scanned traverses and a distributed x-ray source having a plurality of focal spot locations. The distributed x-ray source...

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Bibliographische Detailangaben
Hauptverfasser: Edic, Peter Michael, Harding, Geoffrey, De Man, Bruno K. B, Strecker, Helmut Rudolf
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A system and method for scanning objects using a non-translational x-ray diffraction (XRD) system is disclosed. The system includes a scanning area through which an object to be scanned traverses and a distributed x-ray source having a plurality of focal spot locations. The distributed x-ray source is affixed on the scanning area and is configured to emit x-rays towards the object as a series of parallel x-ray beams. A stationary detector arrangement is affixed on another side of the scanning area generally opposite the distributed x-ray source and is configured to measure a coherent scatter spectra of the x-rays after passing through the object. A data acquisition system (DAS) is connected to the detector arrangement and is configured to measure the coherent scatter spectra, which is utilized to generate XRD data and determine a material composition of at least a portion of the object from the XRD data.