Testing of an embedded multiplexer having a plurality of inputs

Functional testing of an integrated circuit (IC) is a part from a more comprehensive and thorough testing. An IC including an embedded select circuit module coupled to receive numerous input signals. The IC may also include control circuit coupled to receive input control signals, where at least one...

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Bibliographische Detailangaben

1. Verfasser:	Lai, Andrew W
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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