Design features for testing integrated circuits

Systems and methods are disclosed herein to provide test features for integrated circuits. For example, in accordance with an embodiment of the present invention, an integrated circuit includes an input signal path adapted to route an address signal for a configurable memory. An input multiplexer, c...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	White, Allen, Vernenker, Hemanshu T, De La Cruz, Louis
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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