Method for the evaluation of measurement uncertainty, and a device and system thereof

A method for evaluating uncertainty associated with the value of a measurand derived from measurements of a device under test is disclosed. A mathematical model is provided wherein the measurand is expressed as a function of (i) at least one physically observable quantity, and (ii) the reference val...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Yoshihiro, Kazuo, Endo, Tadashi
Format: Patent
Sprache:eng
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