Apparatus and method for obtaining a reflectance property indication of a sample

A method for obtaining a reflectance property indication of a sample which includes making a reflectance measurement of the sample and correcting the reflectance measurement in order to obtain the reflectance property indication. The reflectance measurement represents an observed reflectance of the...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Li, Wei, Chow, Ross, Curtis, Jim Boyd, Chen, Xiaocai Joyce
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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