Time-domain device noise simulator

In general, in one aspect, the disclosure describes a simulator for emulating various types of device noise in time-domain circuit simulations. The simulator is capable of adding noise to transistors as well as passive elements like resistors. The simulator utilizes at least one current source in pa...

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Hauptverfasser: O'Mahony, Frank P, Kutuk, Haydar, Casper, Bryan K, Fayneh, Eyal, Mudanai, Sivakumar, Shih, Wei-kai, Fattouh, Farag
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creator O'Mahony, Frank P
Kutuk, Haydar
Casper, Bryan K
Fayneh, Eyal
Mudanai, Sivakumar
Shih, Wei-kai
Fattouh, Farag
description In general, in one aspect, the disclosure describes a simulator for emulating various types of device noise in time-domain circuit simulations. The simulator is capable of adding noise to transistors as well as passive elements like resistors. The simulator utilizes at least one current source in parallel to a device to emulate the noise. The current source generates a random current output to emulate the device noise based on a random Gaussian number and the standard deviation of the device noise. The noise standard deviation can be determined based on the noise power spectral density of the device having a particular bias at that simulation time and the update time. The simulator is capable of emulating any noise source with a constant or monotonically decreasing noise spectrum (e.g., thermal noise, flicker noise) by utilizing multiple current sources having different update steps. The simulator is compatible with standard circuit simulators.
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fullrecord <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_07650271</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>07650271</sourcerecordid><originalsourceid>FETCH-uspatents_grants_076502713</originalsourceid><addsrcrecordid>eNrjZFAKycxN1U3Jz03MzFNISS3LTE5VyMvPLE5VKM7MLc1JLMkv4mFgTUvMKU7lhdLcDApuriHOHrqlxQWJJal5JcXx6UWJIMrA3MzUwMjc0JgIJQCQsybx</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Time-domain device noise simulator</title><source>USPTO Issued Patents</source><creator>O'Mahony, Frank P ; Kutuk, Haydar ; Casper, Bryan K ; Fayneh, Eyal ; Mudanai, Sivakumar ; Shih, Wei-kai ; Fattouh, Farag</creator><creatorcontrib>O'Mahony, Frank P ; Kutuk, Haydar ; Casper, Bryan K ; Fayneh, Eyal ; Mudanai, Sivakumar ; Shih, Wei-kai ; Fattouh, Farag ; Intel Corporation</creatorcontrib><description>In general, in one aspect, the disclosure describes a simulator for emulating various types of device noise in time-domain circuit simulations. The simulator is capable of adding noise to transistors as well as passive elements like resistors. The simulator utilizes at least one current source in parallel to a device to emulate the noise. The current source generates a random current output to emulate the device noise based on a random Gaussian number and the standard deviation of the device noise. The noise standard deviation can be determined based on the noise power spectral density of the device having a particular bias at that simulation time and the update time. The simulator is capable of emulating any noise source with a constant or monotonically decreasing noise spectrum (e.g., thermal noise, flicker noise) by utilizing multiple current sources having different update steps. The simulator is compatible with standard circuit simulators.</description><language>eng</language><creationdate>2010</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7650271$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64012</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7650271$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>O'Mahony, Frank P</creatorcontrib><creatorcontrib>Kutuk, Haydar</creatorcontrib><creatorcontrib>Casper, Bryan K</creatorcontrib><creatorcontrib>Fayneh, Eyal</creatorcontrib><creatorcontrib>Mudanai, Sivakumar</creatorcontrib><creatorcontrib>Shih, Wei-kai</creatorcontrib><creatorcontrib>Fattouh, Farag</creatorcontrib><creatorcontrib>Intel Corporation</creatorcontrib><title>Time-domain device noise simulator</title><description>In general, in one aspect, the disclosure describes a simulator for emulating various types of device noise in time-domain circuit simulations. The simulator is capable of adding noise to transistors as well as passive elements like resistors. The simulator utilizes at least one current source in parallel to a device to emulate the noise. The current source generates a random current output to emulate the device noise based on a random Gaussian number and the standard deviation of the device noise. The noise standard deviation can be determined based on the noise power spectral density of the device having a particular bias at that simulation time and the update time. The simulator is capable of emulating any noise source with a constant or monotonically decreasing noise spectrum (e.g., thermal noise, flicker noise) by utilizing multiple current sources having different update steps. The simulator is compatible with standard circuit simulators.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2010</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZFAKycxN1U3Jz03MzFNISS3LTE5VyMvPLE5VKM7MLc1JLMkv4mFgTUvMKU7lhdLcDApuriHOHrqlxQWJJal5JcXx6UWJIMrA3MzUwMjc0JgIJQCQsybx</recordid><startdate>20100119</startdate><enddate>20100119</enddate><creator>O'Mahony, Frank P</creator><creator>Kutuk, Haydar</creator><creator>Casper, Bryan K</creator><creator>Fayneh, Eyal</creator><creator>Mudanai, Sivakumar</creator><creator>Shih, Wei-kai</creator><creator>Fattouh, Farag</creator><scope>EFH</scope></search><sort><creationdate>20100119</creationdate><title>Time-domain device noise simulator</title><author>O'Mahony, Frank P ; Kutuk, Haydar ; Casper, Bryan K ; Fayneh, Eyal ; Mudanai, Sivakumar ; Shih, Wei-kai ; Fattouh, Farag</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_076502713</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2010</creationdate><toplevel>online_resources</toplevel><creatorcontrib>O'Mahony, Frank P</creatorcontrib><creatorcontrib>Kutuk, Haydar</creatorcontrib><creatorcontrib>Casper, Bryan K</creatorcontrib><creatorcontrib>Fayneh, Eyal</creatorcontrib><creatorcontrib>Mudanai, Sivakumar</creatorcontrib><creatorcontrib>Shih, Wei-kai</creatorcontrib><creatorcontrib>Fattouh, Farag</creatorcontrib><creatorcontrib>Intel Corporation</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>O'Mahony, Frank P</au><au>Kutuk, Haydar</au><au>Casper, Bryan K</au><au>Fayneh, Eyal</au><au>Mudanai, Sivakumar</au><au>Shih, Wei-kai</au><au>Fattouh, Farag</au><aucorp>Intel Corporation</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Time-domain device noise simulator</title><date>2010-01-19</date><risdate>2010</risdate><abstract>In general, in one aspect, the disclosure describes a simulator for emulating various types of device noise in time-domain circuit simulations. The simulator is capable of adding noise to transistors as well as passive elements like resistors. The simulator utilizes at least one current source in parallel to a device to emulate the noise. The current source generates a random current output to emulate the device noise based on a random Gaussian number and the standard deviation of the device noise. The noise standard deviation can be determined based on the noise power spectral density of the device having a particular bias at that simulation time and the update time. The simulator is capable of emulating any noise source with a constant or monotonically decreasing noise spectrum (e.g., thermal noise, flicker noise) by utilizing multiple current sources having different update steps. The simulator is compatible with standard circuit simulators.</abstract><oa>free_for_read</oa></addata></record>
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title Time-domain device noise simulator
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-01T09%3A16%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=O'Mahony,%20Frank%20P&rft.aucorp=Intel%20Corporation&rft.date=2010-01-19&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E07650271%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true