Passive test circuit used to determine a back EMF of a voice coil motor during application of a bias voltage

Passive test circuit used to determine a back EMF of a voice coil motor during application of a bias voltage

A hard disk drive with a voice coil motor coupled to a head. The head moves relative to a disk. The voice coil motor receives a biasing voltage and has a back emf voltage. A test circuit is coupled to the voice coil motor to determine the back emf voltage. The back emf voltage can be used to analyze...

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Hauptverfasser: Liu, Yanning, Kang, Seong Woo, Chang, Seungman
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creator Liu, Yanning
Kang, Seong Woo
Chang, Seungman
description A hard disk drive with a voice coil motor coupled to a head. The head moves relative to a disk. The voice coil motor receives a biasing voltage and has a back emf voltage. A test circuit is coupled to the voice coil motor to determine the back emf voltage. The back emf voltage can be used to analyze low frequency vibration in the disk drive. The test circuit can be constructed so that the back emf voltage is proportional to a pair of test resistors and/or a pair of test inductors. The biasing voltage allows the back emf voltage to be measured and analyzed while the head is at any location from the ID to the OD of the disk.
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The biasing voltage allows the back emf voltage to be measured and analyzed while the head is at any location from the ID to the OD of the disk.</description><language>eng</language><creationdate>2009</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7633707$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64012</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7633707$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Liu, Yanning</creatorcontrib><creatorcontrib>Kang, Seong Woo</creatorcontrib><creatorcontrib>Chang, Seungman</creatorcontrib><creatorcontrib>Samsung Electronics Co., Ltd</creatorcontrib><title>Passive test circuit used to determine a back EMF of a voice coil motor during application of a bias voltage</title><description>A hard disk drive with a voice coil motor coupled to a head. 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The head moves relative to a disk. The voice coil motor receives a biasing voltage and has a back emf voltage. A test circuit is coupled to the voice coil motor to determine the back emf voltage. The back emf voltage can be used to analyze low frequency vibration in the disk drive. The test circuit can be constructed so that the back emf voltage is proportional to a pair of test resistors and/or a pair of test inductors. The biasing voltage allows the back emf voltage to be measured and analyzed while the head is at any location from the ID to the OD of the disk.</abstract><oa>free_for_read</oa></addata></record>
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title Passive test circuit used to determine a back EMF of a voice coil motor during application of a bias voltage
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