Method and apparatus for eliminating noise induced errors during test of a programmable logic device

A method and apparatus for substantially eliminating noise induced errors caused by a premature start-up sequence between configuration of an integrated circuit (IC) and execution of functional test vectors. A noise elimination sequence is executed, whereby the configuration bitstream associated wit...

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Hauptverfasser:	Simmons, Randy J, Mansour, Teymour M
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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