Crystallographic preferential etch to define a recessed-region for epitaxial growth

A semiconductor device comprising a gate structure on a semiconductor substrate and a recessed-region in the semiconductor substrate. The recessed-region has a widest lateral opening that is near a top surface of the semiconductor substrate. The widest lateral opening undercuts the gate structure.

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Hauptverfasser: Rotondaro, Antonio Luis Pacheco, Hurd, Trace Q, Koontz, Elisabeth Marley
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Sprache:eng
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creator Rotondaro, Antonio Luis Pacheco
Hurd, Trace Q
Koontz, Elisabeth Marley
description A semiconductor device comprising a gate structure on a semiconductor substrate and a recessed-region in the semiconductor substrate. The recessed-region has a widest lateral opening that is near a top surface of the semiconductor substrate. The widest lateral opening undercuts the gate structure.
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fullrecord <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_07528072</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>07528072</sourcerecordid><originalsourceid>FETCH-uspatents_grants_075280723</originalsourceid><addsrcrecordid>eNqNjb0KwkAQBtNYiPoO-wKBEJHYh4i99rJcvvuB4-7YW1Hf3gR8AKtphpltcxvlU5VjzE64-GCoCCwESQNHghpPmmmGDQnEJDCoFXMrcCEnslkIJSi_V91JfqnfNxvLseLw466hy3Qfr-2zFtalXB_LbEU3nPpzN_THP5QvX3g51w</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Crystallographic preferential etch to define a recessed-region for epitaxial growth</title><source>USPTO Issued Patents</source><creator>Rotondaro, Antonio Luis Pacheco ; Hurd, Trace Q ; Koontz, Elisabeth Marley</creator><creatorcontrib>Rotondaro, Antonio Luis Pacheco ; Hurd, Trace Q ; Koontz, Elisabeth Marley ; Texas Instruments Incorporated</creatorcontrib><description>A semiconductor device comprising a gate structure on a semiconductor substrate and a recessed-region in the semiconductor substrate. The recessed-region has a widest lateral opening that is near a top surface of the semiconductor substrate. The widest lateral opening undercuts the gate structure.</description><language>eng</language><creationdate>2009</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7528072$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,780,802,885,64039</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7528072$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Rotondaro, Antonio Luis Pacheco</creatorcontrib><creatorcontrib>Hurd, Trace Q</creatorcontrib><creatorcontrib>Koontz, Elisabeth Marley</creatorcontrib><creatorcontrib>Texas Instruments Incorporated</creatorcontrib><title>Crystallographic preferential etch to define a recessed-region for epitaxial growth</title><description>A semiconductor device comprising a gate structure on a semiconductor substrate and a recessed-region in the semiconductor substrate. The recessed-region has a widest lateral opening that is near a top surface of the semiconductor substrate. The widest lateral opening undercuts the gate structure.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2009</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNqNjb0KwkAQBtNYiPoO-wKBEJHYh4i99rJcvvuB4-7YW1Hf3gR8AKtphpltcxvlU5VjzE64-GCoCCwESQNHghpPmmmGDQnEJDCoFXMrcCEnslkIJSi_V91JfqnfNxvLseLw466hy3Qfr-2zFtalXB_LbEU3nPpzN_THP5QvX3g51w</recordid><startdate>20090505</startdate><enddate>20090505</enddate><creator>Rotondaro, Antonio Luis Pacheco</creator><creator>Hurd, Trace Q</creator><creator>Koontz, Elisabeth Marley</creator><scope>EFH</scope></search><sort><creationdate>20090505</creationdate><title>Crystallographic preferential etch to define a recessed-region for epitaxial growth</title><author>Rotondaro, Antonio Luis Pacheco ; Hurd, Trace Q ; Koontz, Elisabeth Marley</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_075280723</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2009</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Rotondaro, Antonio Luis Pacheco</creatorcontrib><creatorcontrib>Hurd, Trace Q</creatorcontrib><creatorcontrib>Koontz, Elisabeth Marley</creatorcontrib><creatorcontrib>Texas Instruments Incorporated</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Rotondaro, Antonio Luis Pacheco</au><au>Hurd, Trace Q</au><au>Koontz, Elisabeth Marley</au><aucorp>Texas Instruments Incorporated</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Crystallographic preferential etch to define a recessed-region for epitaxial growth</title><date>2009-05-05</date><risdate>2009</risdate><abstract>A semiconductor device comprising a gate structure on a semiconductor substrate and a recessed-region in the semiconductor substrate. The recessed-region has a widest lateral opening that is near a top surface of the semiconductor substrate. The widest lateral opening undercuts the gate structure.</abstract><oa>free_for_read</oa></addata></record>
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title Crystallographic preferential etch to define a recessed-region for epitaxial growth
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-18T19%3A23%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Rotondaro,%20Antonio%20Luis%20Pacheco&rft.aucorp=Texas%20Instruments%20Incorporated&rft.date=2009-05-05&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E07528072%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true