Versatile materials probe

Versatile materials probe

Disclosed is an electrical measurement probe including two probe blocks, each probe block having a connection face and a measurement face. Each probe block also includes a plurality of spring loaded pogo pins. Each pogo pin has a first end that extends to the connection face and a second end that pr...

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Hauptverfasser: Fredericksen, Ross T, Gilliland, Don A
Format: Patent
Sprache:eng
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creator Fredericksen, Ross T
Gilliland, Don A
description Disclosed is an electrical measurement probe including two probe blocks, each probe block having a connection face and a measurement face. Each probe block also includes a plurality of spring loaded pogo pins. Each pogo pin has a first end that extends to the connection face and a second end that protrudes from the measurement face. The two probe blocks are attached to a top plate. The top plate is attached to a face of each probe block opposite to the measurement face of the probe block.
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fullrecord <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_07508226</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>07508226</sourcerecordid><originalsourceid>FETCH-uspatents_grants_075082263</originalsourceid><addsrcrecordid>eNrjZJAMSy0qTizJzElVyE0sSS3KTMwpVigoyk9K5WFgTQNyUnmhNDeDgptriLOHbmlxAVBlXklxfHpRIogyMDc1sDAyMjMmQgkAF_0jsw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Versatile materials probe</title><source>USPTO Issued Patents</source><creator>Fredericksen, Ross T ; Gilliland, Don A</creator><creatorcontrib>Fredericksen, Ross T ; Gilliland, Don A ; International Business Machines Corporation</creatorcontrib><description>Disclosed is an electrical measurement probe including two probe blocks, each probe block having a connection face and a measurement face. Each probe block also includes a plurality of spring loaded pogo pins. Each pogo pin has a first end that extends to the connection face and a second end that protrudes from the measurement face. The two probe blocks are attached to a top plate. The top plate is attached to a face of each probe block opposite to the measurement face of the probe block.</description><language>eng</language><creationdate>2009</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7508226$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,309,781,803,886,64043</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7508226$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Fredericksen, Ross T</creatorcontrib><creatorcontrib>Gilliland, Don A</creatorcontrib><creatorcontrib>International Business Machines Corporation</creatorcontrib><title>Versatile materials probe</title><description>Disclosed is an electrical measurement probe including two probe blocks, each probe block having a connection face and a measurement face. Each probe block also includes a plurality of spring loaded pogo pins. Each pogo pin has a first end that extends to the connection face and a second end that protrudes from the measurement face. The two probe blocks are attached to a top plate. The top plate is attached to a face of each probe block opposite to the measurement face of the probe block.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2009</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZJAMSy0qTizJzElVyE0sSS3KTMwpVigoyk9K5WFgTQNyUnmhNDeDgptriLOHbmlxAVBlXklxfHpRIogyMDc1sDAyMjMmQgkAF_0jsw</recordid><startdate>20090324</startdate><enddate>20090324</enddate><creator>Fredericksen, Ross T</creator><creator>Gilliland, Don A</creator><scope>EFH</scope></search><sort><creationdate>20090324</creationdate><title>Versatile materials probe</title><author>Fredericksen, Ross T ; Gilliland, Don A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_075082263</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2009</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Fredericksen, Ross T</creatorcontrib><creatorcontrib>Gilliland, Don A</creatorcontrib><creatorcontrib>International Business Machines Corporation</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Fredericksen, Ross T</au><au>Gilliland, Don A</au><aucorp>International Business Machines Corporation</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Versatile materials probe</title><date>2009-03-24</date><risdate>2009</risdate><abstract>Disclosed is an electrical measurement probe including two probe blocks, each probe block having a connection face and a measurement face. Each probe block also includes a plurality of spring loaded pogo pins. Each pogo pin has a first end that extends to the connection face and a second end that protrudes from the measurement face. The two probe blocks are attached to a top plate. The top plate is attached to a face of each probe block opposite to the measurement face of the probe block.</abstract><oa>free_for_read</oa></addata></record>
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title Versatile materials probe
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-17T07%3A38%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Fredericksen,%20Ross%20T&rft.aucorp=International%20Business%20Machines%20Corporation&rft.date=2009-03-24&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E07508226%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true