Measurement method of three-dimensional profiles and reconstruction system thereof using subpixel localization with color gratings and picture-in-picture switching on single display

Measurement method of three-dimensional profiles and reconstruction system thereof using subpixel localization with color gratings and picture-in-picture switching on single display

The present invention is a measurement method of three-dimensional profiles and a reconstruction system thereof using subpixel localization with color gratings and picture-in-picture switching on a single display, wherein the measurement method includes: 1. Preparation step; 2. Projection step; 3. I...

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Hauptverfasser: Lin, Chern-Sheng, Lee, Jyh-Fa, Yeh, Mau-Shiun, Lin, Chia-Hau, Ku, Shih-Liang
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creator Lin, Chern-Sheng
Lee, Jyh-Fa
Yeh, Mau-Shiun
Lin, Chia-Hau
Ku, Shih-Liang
description The present invention is a measurement method of three-dimensional profiles and a reconstruction system thereof using subpixel localization with color gratings and picture-in-picture switching on a single display, wherein the measurement method includes: 1. Preparation step; 2. Projection step; 3. Image extraction step; 4. Image fine-tuning step; 5. Image processing step; and 6. Reconstruction step. The system includes: a projection apparatus, emitting a grating towards a workpiece under measurement, and forming a grating image on the workpiece under measurement, the contrast values of the plurality of grating stripes of the grating image being identical; a central processing unit, using the grating image and picture-in-picture of a display thereof to fine tune and reconstruct three-dimensional profiles of the workpiece under measurement. Thereby, the grating stripes have equal contrast for easier identification; the display has switchable picture-in-picture; and an adjustment module can adjust the grating.
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Preparation step; 2. Projection step; 3. Image extraction step; 4. Image fine-tuning step; 5. Image processing step; and 6. Reconstruction step. The system includes: a projection apparatus, emitting a grating towards a workpiece under measurement, and forming a grating image on the workpiece under measurement, the contrast values of the plurality of grating stripes of the grating image being identical; a central processing unit, using the grating image and picture-in-picture of a display thereof to fine tune and reconstruct three-dimensional profiles of the workpiece under measurement. 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Preparation step; 2. Projection step; 3. Image extraction step; 4. Image fine-tuning step; 5. Image processing step; and 6. Reconstruction step. The system includes: a projection apparatus, emitting a grating towards a workpiece under measurement, and forming a grating image on the workpiece under measurement, the contrast values of the plurality of grating stripes of the grating image being identical; a central processing unit, using the grating image and picture-in-picture of a display thereof to fine tune and reconstruct three-dimensional profiles of the workpiece under measurement. 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Preparation step; 2. Projection step; 3. Image extraction step; 4. Image fine-tuning step; 5. Image processing step; and 6. Reconstruction step. The system includes: a projection apparatus, emitting a grating towards a workpiece under measurement, and forming a grating image on the workpiece under measurement, the contrast values of the plurality of grating stripes of the grating image being identical; a central processing unit, using the grating image and picture-in-picture of a display thereof to fine tune and reconstruct three-dimensional profiles of the workpiece under measurement. Thereby, the grating stripes have equal contrast for easier identification; the display has switchable picture-in-picture; and an adjustment module can adjust the grating.</abstract><oa>free_for_read</oa></addata></record>
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title Measurement method of three-dimensional profiles and reconstruction system thereof using subpixel localization with color gratings and picture-in-picture switching on single display
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