Functional and stress testing of LGA devices

Improved methods, systems, and apparatuses are disclosed for testing LGA devices. One example embodiment include vertical routing of test nest assembly cooling lines in order to minimize the test nest footprint and increase available test sites on a single test card. Another example embodiment inclu...

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Bibliographische Detailangaben

Hauptverfasser:	Corbin, Jr, John Saunders, Garza, Jose Arturo, Kent, Dales Morrison, Larsen, Kenneth Carl, Mahaney, Jr, Howard Victor, Phan, Hoa Thanh, Salazar, John Joseph
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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