Apparatus and method for skew measurement
A skew measurement system and method wherein each of the signals among which the skew is to be determined is connected one at a time to a clock recovery loop. The locked state of the clock recovery loop is used as an indicator of the skew of the data signal relative to the internal clock of the cloc...
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creator | Devnath, Varadarajan Ceekala, Vijaya Wieser, James B Whitcomb, Lawrence K |
description | A skew measurement system and method wherein each of the signals among which the skew is to be determined is connected one at a time to a clock recovery loop. The locked state of the clock recovery loop is used as an indicator of the skew of the data signal relative to the internal clock of the clock recovery loop. By measuring the difference between the locked state of different signals, their relative skew can be measured. |
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fullrecord | <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_07454647</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>07454647</sourcerecordid><originalsourceid>FETCH-uspatents_grants_074546473</originalsourceid><addsrcrecordid>eNrjZNB0LChILEosKS1WSMxLUchNLcnIT1FIyy9SKM5OLQfyE4tLi1JzU_NKeBhY0xJzilN5oTQ3g4Kba4izh25pcUFiCVBBcXx6USKIMjA3MTUxMzE3JkIJAOHvKbQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Apparatus and method for skew measurement</title><source>USPTO Issued Patents</source><creator>Devnath, Varadarajan ; Ceekala, Vijaya ; Wieser, James B ; Whitcomb, Lawrence K</creator><creatorcontrib>Devnath, Varadarajan ; Ceekala, Vijaya ; Wieser, James B ; Whitcomb, Lawrence K ; National Semiconductor Corporation</creatorcontrib><description>A skew measurement system and method wherein each of the signals among which the skew is to be determined is connected one at a time to a clock recovery loop. The locked state of the clock recovery loop is used as an indicator of the skew of the data signal relative to the internal clock of the clock recovery loop. By measuring the difference between the locked state of different signals, their relative skew can be measured.</description><language>eng</language><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7454647$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64012</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7454647$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Devnath, Varadarajan</creatorcontrib><creatorcontrib>Ceekala, Vijaya</creatorcontrib><creatorcontrib>Wieser, James B</creatorcontrib><creatorcontrib>Whitcomb, Lawrence K</creatorcontrib><creatorcontrib>National Semiconductor Corporation</creatorcontrib><title>Apparatus and method for skew measurement</title><description>A skew measurement system and method wherein each of the signals among which the skew is to be determined is connected one at a time to a clock recovery loop. The locked state of the clock recovery loop is used as an indicator of the skew of the data signal relative to the internal clock of the clock recovery loop. By measuring the difference between the locked state of different signals, their relative skew can be measured.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZNB0LChILEosKS1WSMxLUchNLcnIT1FIyy9SKM5OLQfyE4tLi1JzU_NKeBhY0xJzilN5oTQ3g4Kba4izh25pcUFiCVBBcXx6USKIMjA3MTUxMzE3JkIJAOHvKbQ</recordid><startdate>20081118</startdate><enddate>20081118</enddate><creator>Devnath, Varadarajan</creator><creator>Ceekala, Vijaya</creator><creator>Wieser, James B</creator><creator>Whitcomb, Lawrence K</creator><scope>EFH</scope></search><sort><creationdate>20081118</creationdate><title>Apparatus and method for skew measurement</title><author>Devnath, Varadarajan ; Ceekala, Vijaya ; Wieser, James B ; Whitcomb, Lawrence K</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_074546473</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2008</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Devnath, Varadarajan</creatorcontrib><creatorcontrib>Ceekala, Vijaya</creatorcontrib><creatorcontrib>Wieser, James B</creatorcontrib><creatorcontrib>Whitcomb, Lawrence K</creatorcontrib><creatorcontrib>National Semiconductor Corporation</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Devnath, Varadarajan</au><au>Ceekala, Vijaya</au><au>Wieser, James B</au><au>Whitcomb, Lawrence K</au><aucorp>National Semiconductor Corporation</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Apparatus and method for skew measurement</title><date>2008-11-18</date><risdate>2008</risdate><abstract>A skew measurement system and method wherein each of the signals among which the skew is to be determined is connected one at a time to a clock recovery loop. The locked state of the clock recovery loop is used as an indicator of the skew of the data signal relative to the internal clock of the clock recovery loop. By measuring the difference between the locked state of different signals, their relative skew can be measured.</abstract><oa>free_for_read</oa></addata></record> |
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title | Apparatus and method for skew measurement |
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