Test scan cells

A sequential scan cell includes an input port for functional data and an input for scan test data. The input for scan test data is an input to a master scan flip-flop coupled to a slave scan flip-flop defining a scan test circuit. Such a scan test circuit is coupled to the functional circuit of the...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Jaber, Talal K, Sabbavarapu, Anil K
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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