Monitoring system for high-voltage switches

A method and an apparatus are disclosed for measuring contact erosion in an electrical switching device by a dynamic resistance measurement (DRM). To determine an overlap time and a contact erosion in an exemplary switching device, a change in current across the switching device can be measured indi...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Hagel, Marek, Fehlmann, Patrick
Format: Patent
Sprache:eng
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