Apparatus and method for high speed sampling or testing of data signals using automated testing equipment

A test method allows testing of source-synchronous high-speed wide busses on automatic testing equipment for at-speed characterization and production at-speed testing. An integrated circuit that is verified using the method and systems including such an integrated circuit are also disclosed. The inv...

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Bibliographische Detailangaben

Hauptverfasser:	Birk, Gershom, Ferguson, Kenneth William
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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