Apparatus, system and method for testing electronic elements

An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region config...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Li, Kuang-Jung, Hsu, Chin-Chen, Lin, Yi-Li, Wu, Shyan-I
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!