Methods and apparatus for inline variability measurement of integrated circuit components

Methods and apparatus for inline variability measurement of integrated circuit components

A method of measuring variability of integrated circuit components is provided. A specified parameter of at least one first array configuration comprising a plurality of the integrated circuit components without specified internal connections between the integrated circuit components is measured. Th...

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Hauptverfasser: Bhushan, Manjul, Gettings, Karen M. G. V, Haensch, Wilfried E, Ji, Brian L, Ketchen, Mark B
Format: Patent
Sprache:eng
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creator Bhushan, Manjul
Gettings, Karen M. G. V
Haensch, Wilfried E
Ji, Brian L
Ketchen, Mark B
description A method of measuring variability of integrated circuit components is provided. A specified parameter of at least one first array configuration comprising a plurality of the integrated circuit components without specified internal connections between the integrated circuit components is measured. The specified parameter of at least one second array configuration comprising a plurality of the integrated circuit components nominally identical to those of the first array configuration with specified internal connections between the integrated circuit components is also measured. A variation coefficient is determined for the integrated circuit components based on the measured specified parameter of the at least one first array configuration and the at least one second array configuration.
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title Methods and apparatus for inline variability measurement of integrated circuit components
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